Sensors

MCUs improve safety for automotive chassis systems

17th October 2014
Nat Bowers
0

Claimed to include the world's first automotive chassis MCUs that utilise a 40nm process, the RH850/P1x series of 32-bit MCUs utilise the Renesas-exclusive metal oxide nitride oxide silicon (MONOS) structure. This reduces power consumption and improves functional safety system development efficiency for electrical power steering, brake and other chassis systems.

Simplifying safety design for automotive chassis systems, the MCUs, introduced by Renesas, are certified to ASIL-D standards. The MONOS structure enables fast data read performance and low power consumption (claimed to be approximately half that of earlier Renesas products). This allows a single power supply with integrated core voltage generation regulator and a standard QFP package to be used.

For applications requiring a high fault-detection rate and short control cycles, the RH850/P1x MCUs integrate a variety of fault-detection functions: the CPU employs a lockstep2 system; an ECC function detects and corrects data errors affecting memory; and other fault-detection functions allow system-level diagnostics of the timers, ADC, serial communication and other modules. There is also a built-in self-test function which detects faults affecting the fault-detection functions themselves. When an error signal is received, the ECU can set an error pin output, generate interrupts or resets, helping to ensure safety and reliability.

The 32-bit MCUs incorporate two enhanced motor control timers designed to improve the motor control performance of chassis systems. The devices include a CAN protocol engine and RS-CAN for serial communications which increases the number of transmit and receive message buffers while making the buffers easier to use.

The RH850/P1x series MCUs are sampling now, with mass production of 3,000,000 units per month expected in 2016.

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