TPS7H2221-SEP Total Ionizing Dose (TID)
This report discusses the results of the total-ionizing dose (TID) testing for the Texas Instruments TPS7H2221- SEP, Radiation Tolerant 5.5-V, 1.25-A Load Switch. The study was done to determine TID effects under low dose rate (LDR) up to 50krad(Si) and high dose rate (HDR) up to 30krad(Si). The results show that all samples passed within the specified limits up to 50krad(Si) LDR and up to 20krad(Si) HDR with VIN Shutdown Current marginally exceeding the datasheet limt at 30krad(Si) HDR. The TPS7H2221-SEP adheres to a radiation lot acceptence testing (RLAT) level of 20krad(Si) LDR.