Power

GaN: From watts to kilowatts

14th March 2019
Lanna Cooper

Texas Instruments' integrated approach to GaN offers ease of design with a compact single chip solution, high efficiency due to optimised gate drive layout, and high reliability with integrated over-current protection and 20 Million hours of device reliability hours.

With devices from 150mΩ to 50mΩ, TI has a GaN solution for every application.

Featured products

Upcoming Events

View all events
Newsletter
Latest global electronics news