SEM image detectors enhance performance & reliability

  Manufactured at nanoelectrics research centre imec and integrated in FEI Company’s SEMs (Scanning Electron Microscopes), the set of bespoke high-quality electron detector die products will help enhance the SEMs’ performance and reliability.

Imec was responsible for the development and processing of the back-scattered and stem electron sensors, according to FEI’s custom specifications, with focus on sensitivity to low energy electrons and high reliability.

The imec portfolio contains a wide variety of device technologies on its 200mm process line such as CMOS, Si-photonics, MEMS, image sensors and packaging, and the company also provides design, testing and reliability.

Imec provides a range of services, from feasibility studies over design and technology development to prototyping and low-volume manufacturing. Through its alliances, imec can also offer a path to transfer the technology to a foundry for volume production.

Keep Up to Date with the Most Important News

By pressing the Subscribe button, you confirm that you have read and are agreeing to our Privacy Policy and Terms of Use
Previous Post

Cardiff University adopts 3D metal printing

Next Post

DC/DC converters provide configurable output voltage