The NanoScan 2 system uses moving slits – one of the ISO standard scanning aperture techniques – to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts, without attenuation. Detector options (silicon, germanium, and pyroelectric technologies) allow measurement at wavelengths from ultraviolet to far infrared. It can simultaneously measure multiple beams and offers an optional power meter for scanheads with silicon and germanium detectors
NanoScan 2 software can measure from one to 16 beams in the NanoScan aperture, all with sub-micron precision. A beam can be found is less than 0.3 seconds and real-time updates can be displayed to 20 Hz. The graphical user interface (GUI) supports the Microsoft® Windows ribbon toolbar, and dockable and floatable windows. Support for ActiveX automation lets users integrate NanoScan into OEM systems or write their own user interfaces.
M2 Wizard
The NanoScan 2 M2 Wizard is a quick and easy way to determine the times-diffraction propagation factor (M2) of a laser using the Rayleigh Method. The Wizard guides the user through a series of measurements required for calculating M2. An optional Rayleigh Range Translation Test Fixture (RAL-FXT) provides convenient translation of the NanoScan scanhead assembly and a digital readout of its relative position along the Z-axis.
Optional Power Meter
The silicon and germanium NanoScan 2 systems include a 200 mW power meter option that can be calibrated against the user’s ISO- or NIST traceable power meter. The system software displays both the total power and individual power in each of the beams being measured.
Availability & Pricing
The NanoScan 2 system is available now. US system prices start at $4,695.