The C360659-UV-1 offers high responsivity at 500 nm with a very low noise floor. This new solution delivers superior performance in demanding applications such as fluorescence detection, high energy physics, safety radiation detection, optical tomography, and environmental monitoring.
“Excelitas continually seeks to provide its customers with unparalleled industry knowledge and expertise in the design and development of sophisticated optoelectronic sensors,” said Michael Ersoni, Senior Vice President and General Manager of Excelitas Technologies’ global detection business. “With the release of the C360659-UV-1, we’ve expanded our world-class short wavelength enhanced APD offerings that can be fully customized to meet the unique needs of our customers.”
The C360659-UV-1 will be on display at SPIE Photonics West, Booth #4421, from February 5-7, 2013 in San Francisco, CA, along with Excelitas’ other detection and high performance optoelectronic solutions.