MWC2017: LoRa-enabled IoT devices get test solution

1st March 2017
Mick Elliott

Anritsu is to create new test and measurement solutions for R&D, certification and manufacturing of LoRa-equipped IoT devices. LoRa Technology, developed by Semtech is a wireless RF solution for LPWAN devices. LoRaWAN is a standardised protocol based on LoRa Technology that is supported by the LoRa Alliance ecosystem of over 400 member companies.

Anritsu products, such as the RF Signal Analyser/Signal Generator MS2830A used in R&D and the MT8870A used in manufacturing tests, are general purpose products that can be adapted to test IoT standards such as LoRaWAN.

At Mobile World Congress in Barcelona Anritsu is demonstrating a preliminary version of a measurement solution for LoRaWAN product testing.

Jonathan Borrill, Director of Engineering and Technology at Anritsu EMEA says the company is delivering a much needed solution. “This technology is becoming a reality. It is moving into production volumes so manufacturers need production test equipment – with the MT8870A we can offer an off the shelf test solution.”

“We have been working with both Semtech and IMST in Germany to develop these test solutions,” he adds.

With accelerating LoRaWAN adoption by Network Operators and private enterprises worldwide, the LoRaWAN ecosystem is demanding more advanced test and measurement tools to provide quality implementation of its IoT solutions.

Anritsu is part of the LoRa Alliance and will work closely with the technical committee and its members to offer the required test and measurement products that will help the LoRa Alliance members design, certify and manufacture to the standards as required.

“The rapidly expanding number of LoRa-based sensor nodes around the world requires additional resources for testing and measurement,” said Vivek Mohan, Director of Wireless Products for Semtech’s Wireless and Sensing Products Group. “Anritsu’s measurement solutions will help ensure regulatory compliance of LoRa end nodes and quality of connections.”



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