The K-50 Series probes utilize independent probes arranged to effectively create a ground “shield.” The independent probes offer a tremendous advantage compared to cylindrical ground shield designs in that the probes can articulate to absorb much greater device-under-test tolerances, fixture tolerances and flexure when used in “plunge-to-board” test applications.
Each of the ground and signal probes are replaceable and feature an instrument grade Pogo Pin architecture, which is designed for up to 90 percent compression vs. the 2/3rds compression limit of typical Pogo designs. The K-50 Series is designed to be used as a port extender for network analyzers and can be used freehand or mounted in a test fixture as a modular component. Additionally, the probes can be transferred to a new fixture upon revision or obsolescence of the DUT.
With highly repeatable measurement capabilities ranging from 4-12 Ghz, the K-50 Series products offer a convenient off-the-shelf solution for reliable broadband measurements in high-volume manufacturing environments.
Standard or custom K-50 Series probes can be ordered from ECT directly or via distribution partners and are featured in ECT’s latest Automotive and Industrial Catalog.