At the heart of Datalight’s new file system diagnostics are full metadata and optional file data CRCs (Cyclic Redundancy Checks), which enable developers to continuously monitor data reliability in any embedded system. Unlike basic file systems such as ext4 and TexFAT, Reliance Nitro is capable of monitoring both user data and metadata to detect inconsistencies and provide early warning of imminent flash failure and/or data corruption.
As flash memory manufacturers create smaller dies with more bits per cell, bit errors and data corruption are becoming bigger problems for device developers and users with minimum data reliability requirements. Undiscovered problems with data can cause system failure hours or days later, often leaving no trace of what caused them. By allowing continuous monitoring of data reliability on key files, Reliance Nitro effectively guarantees reliable operations of these devices.
“Our support teams are often asked to help diagnose field failures and track down problems with flash memory during development,” said Ken Whitaker, Datalight VP of Engineering. “The diagnostics in this new version of Reliance Nitro will save our customers hundreds of hours of troubleshooting time.”
Reliance Nitro was designed from the ground up for high performance applications. Dynamic Transaction Point technology provides 100% immunity from file corruption, even after unexpected system interruption. Reliance Nitro goes through extensive reliability testing, including more than 2 million random power cycle tests without a failure. Embedded applications can benefit from faster boot times after power loss, regardless of disk size. Datalight flash file system products are available on VxWorks, Windows Embedded Compact, Windows Embedded Handheld, Linux and many other RTOS operating systems.