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SMARC test adapter allows for 100% contacting reliability

10th April 2015
Siobhan O'Gorman
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A test adapter for the SMARC CoM standard, which allows for 100% contacting reliability, has been released by Yamaichi Electronics. The adapter utilises spring probe pins, allowing very high contact cycles to be reached. The SMARC test adapter is a performance controlled system according to the Standardization Group for Embedded Technologies SMARC specification.

As a contact system, the device is durable and highly reliable. The adapter is volume test ready, which increases the test output, reducing the cost per module. Providing easy and secure operation, the SMARC test adapter is suitable for evaluation bench tests and reliability tests from -50 up to +150°C.

The socket is designed with compression mount technology, removing the need for soldering. Selected materials, such as aircraft aluminium, PEEK and ceramic PEEK, make the adapter robust.

SMARC modules use gold pads as contacting surfaces. The best contacts for such surface areas are fine pitch probe pins, which have a very long life time. The life time for the SMARC test adapter is specified up to 50k mechanical cycles.

For contacting the module pads, a conical type plunger tip is commonly used. By using such a tip it can be assured that only a very small witness mark is formed on the module contact pad. The fine-pitch pins are available for pitches starting from 0.3mm. On request, Kelvin type pins are available.

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