Reliable eUSB 3.1 device targets IoT applications

7th March 2017
Alice Matthews


Micron's new eU500 embedded Universal Serial Bus (eUSB) device has been integrated with Hyperstone's U9 - USB 3.1 flash memory controller and flash management technology. Both companies cooperated to bring a robust flash storage solution to market that is specifically tailored to satisfy highest quality, endurance and reliability requirements.

The U9, together with Hyperstone's hyMap Flash Translation Layer (FTL) and hyReliabilityT firmware feature-set, provides enhanced endurance and data retention management, as well as rigorous power fail-safe features. Its read disturb management and dynamic data refresh features maximise data retention and refresh data that is subject to read disturbance. The U9 complements Micron's flash technology to enable eUSB for demanding markets.

The eU500 is compliant with USB 3.1 Gen 1, SuperSpeed, Hi-Speed, and Full-Speed modes achieving what the company claims to be significantly superior performance compared to USB 2.0 solutions while maintaining backward compatibility. With a sequential read/write speed of up to 170/120 MB/s and a Steady State 4K random read/write performance of 3,000/1,000 IOPS, this eUSB device offers great performance across many usage patterns - its fast random access makes it suitable for rapid boot-up and data logging.

Its small size (36.90x26.6x6.6mm) and the low power consumption of the U9 controller (less than 300mW when actively reading or writing data) allows it to be used in space and power-constrained situations. Micron's eU500 is optimised for next-gen Internet of Things (IoT), for boot drives and data logging applications such as networking, embedded computing and server.

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