NextPowerS3 MOSFETs for DC-DC buck regulators

In a drive to improve efficiency in switched-mode power supplies, MOSFET manufacturers are producing faster-switching devices with reduced capacitances. Whilst this helps to reduce switching losses, the resultant voltage node spikes and ringing, together with coupled gate glitches and the opportunity for “shoot through”, can cause EMI and reliability concerns. Dr Dilder Chowdhury describes the physics behind these phenomena and explains how NXP is addressing the problem.