Extremely reliable: the new Swissbit C-400 series CompactFlash card
LTE throughput analysis using Rohde & Schwarz signal generators and analyzers with SPW
Micron P320h 2.5-Inch PCIe SSD

LTE throughput analysis using Rohde & Schwarz signal generators and analyzers with SPW

This video demonstrates the evaluation of various RF and baseband performance measures for LTE devices using signal generators and analyzers from Rohde & Schwarz in combination with algorithm design and modeling tools from Synopsys. Based on an LTE Release 9 dual-layer beamforming scenario, the measurement of characteristics, such as data throughput, is being explained as an example.

https://www.youtube.com/watch?v=b09klN3gdKg

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