Low-cost and defect-free graphene
How to use MMCX connectors to create unplanned test points
Indium to Present at IWLPC 2016

How to use MMCX connectors to create unplanned test points

In this video, we look at a measurement that hasn’t been possible to make until now: High-side and low-side VGS measurements on a half bridge switching circuit, which uses two eGaN FETs as the switches.

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Low-cost and defect-free graphene

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Indium to Present at IWLPC 2016