JTAG’s extensive ‘Symphony’ range of 3rd party tester integration products will be on display. Use of the Symphony options allows the very latest professional JTAG/boundary-scan capabilities to be added to existing ATE from Teradyne, Keysight, SPEA, Seica, NI and others.
The JT 5705/FXT Multi-Function Testerwill also be on parade, It is an example of JTAG’s ‘fixture embedded’ test technology. The tester is built into one of the small linear series of cassette-based re-configurable fixtures of Everett Charles Technologies (ECT).
It is a compact, single-board test system that supports analog measurement and stimulus, frequency measurements, digital I/O, boundary-scan testing and also in-system device programming. Within the fixture multiple JT 5705/FXT tester cards can be mounted on purpose–built carriers featuring the ATE industry standard ‘Pylon’ connectors, making test system build a snap.
A modular concept of a newly designed base-level 19in. U rack-mount chassis assembly that can house up to four customer-specified modules offering various JTAG (IEEE 1149.x) controllers, digital IO and analogue IO and other measurement features.
The modules are either ½ rack or ¼ rack width and are available in different configurations.