Eddie Hofer, Rockwell Collins, will explore ‘Electronic Components and Material Compatibility Guideline to aide in the evaluation of materials with chemistries used in today’s cleaning processes, with a Report on Committee activity’.
Don Dupriest, Lockheed Martin, will discuss ‘Auditing Suppliers to Assure Materials Meet Process Specifications’.
Amanda Rickman, Raytheon, will present on ‘Parylene Process Optimization and other Vacuum Deposited Coatings’.