Events News

Corelis showcases products at two premier industry events

9th April 2024
Sheryl Miles

Corelis, a specialist in JTAG Boundary-Scan technology and embedded hardware test solutions, is thrilled to announce its participation in two premier industry events.

You can find them at either the IPC APEX EXPO 2024 in Anaheim, California, or the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.

Corelis will showcase its latest embedded hardware test solutions, bus analyser tools, and other JTAG boundary-scan products, renowned for their ease-of-use, and exceptional features.

Corelis’ latest advancements include the PXIe SCAN IO-112, a multifunction I/O module that features configurable voltage(s) with digital I/O, LVDS, IEEE-1149.6, and analog channels in a PXIe form factor. This addition serves as the ideal solution for extending test coverage within embedded and boundary-scan test systems.

Additionally, they have incorporated the IEEE-1149.1-2013 standard into our ScanExpress application, providing new technical features beneficial to semiconductor companies. Corelis has also expanded its engineering services to offer BSDL file validation services to semiconductor companies, reinforcing its commitment to innovation and excellence in high-performance testing.

Conference attendees are warmly invited to visit Corelis at IPC APEX EXPO 2024, Booth 1747, and embedded world 2024, Hall 4, Booth 4-108 to explore their solutions.

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