Automotive test solutions motor into Munich

9th November 2017

Mick Elliott

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A line of test solutions for automotive, communications and consumer devices together with metrology and advanced E-beam lithography systems will be showcased by Advantest at SEMICON EUROPA in Munich (14-17 November). Show attendees can learn about Advantest’s latest product developments in semiconductor test.

Featured will be the company’s V93000 platform offering a complete solution for automotive consumer and RF devices with expanded test coverage and outstanding efficiencies.

Also highlighted will be the T2000 platform that offers the ability to meet today’s advanced device and module testing needs at a low cost-of-test, allowing semiconductor manufacturers to quickly address the quality and performance requirements of automotive ICs and MCUs.

On display will be Advantest’s Cloud Testing Service, providing access to the latest high-quality test methods utilising advanced IP, characterisation tools, analysis systems and more for design and DFT engineers.

For attendees interested in advanced metrology and nano-patterning applications, the stand will include exhibits on Advantest’s line of E3310, E3640and E5610 SEMs for inspecting next-generation wafers, photomasks and blanks, as well as the F7000 system enabling direct writing e-beam lithography at advanced technology nodes.

In the Power Electronics Conference at 9:25 on 15 November, Advantest technologists will present “Addressing Challenges Testing Complex Power Analogue Semiconductors.”