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AI innovations brought to embedded world

31st January 2020
Alex Lynn
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Parasoft has announced that it is bringing this expertise to embedded development at the embedded world show, 2020. With the new release of Parasoft C/C++test, embedded developers will benefit from augmented workflows that leverage AI and machine learning to boost efficiency.

Parasoft C/C++test will be on show at embedded world, and is used for reducing the burden of achieving compliance with security, functional safety, and coding standards such as MISRA, CERT, ISO 26262, DO-178B/C, IEC 61508, IEC 62304, and AUTOSAR.

At the upcoming embedded world exhibition Parasoft will be showcasing the following highlights: 

  • Application of advanced code analysis for C/C++ and Java to drive increases in structural coverage from Unit Testing. This reduces the burden of testing efforts required by standards such as ISO 26262 (Automotive), DO-178B (Aerospace), IEC 62304 (Medical Devices) and IEC 61508 (Functional Safety).
  • Application of AI/Machine Learning to help organisations with the adoption of Static Analysis. Parasoft’s AI-solution reviews new static analysis findings in the context of both historical interactions with the code base and prior static analysis findings to predict relevance and prioritise the new findings.
  • Leading support for automated enforcement of industry coding guidelines with expanded coverage for updated security standards (e.g. the 2019 CWE Top 25 and ‘on the cusp’), AUTOSAR C++14 and the new MISRA C 2012 Amendment 3, ensuring Parasoft’s tools continue to meet the changing needs of the industry by keeping pace with guideline requirements.
  • New integrations with Polarion, codeBeamer and Jira, for enhanced requirements traceability. The bidirectional data exchange bridges the gap between requirements and the tests that validate them, to offer full traceability down to the code being developed, helping fulfil compliance to developing process standards such as ISO 26262 (Automotive), DO-178B (Aerospace), IEC 62304 (Medical Devices) and IEC 61508 (Functional Safety).

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