Analysis

Nordson DAGE to Highlight the Industry’s Ultimate High-Magnification X-ray Inspection System at SMTAI 2011

21st September 2011
ES Admin
Nordson DAGE, will showcase its XD7600NT Diamond X-ray inspection system in Booth #301 at the upcoming SMTA International Conference & Exhibition, scheduled to take place October 18-19, 2011 at the Fort Worth Convention Center in Fort Worth, Texas.
The Nordson DAGE XD7600NT Diamond X-ray inspection system utilizes the latest technology, flat panel detector and proven feature recognition capability to provide the ultimate choice for the highest quality in X-ray imaging on the market today. Equipped with the unique Nordson DAGE NT maintenance-free, sealed transmissive X-ray tube, providing 100 nanometer (0.1 µm) feature recognition and up to 10 watts of power, together with the 3 mega pixel long lifetime CMOS flat panel detector, the XD7600NT Diamond is the crystal clear choice for the greatest performance and highest magnification of real-time imaging.

At the show, Nordson DAGE also will demonstrate its µCT 3D modeling and volumetric measurement ideally suited for analytical investigation of critical applications such as stacked die, MEMS, PiP and PoP devices.

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