ASSET's new FPGA-controlled test (FCT) inserts and operates a board-tester-in-a-chip
Nordson DAGE to Highlight the Industry’s Ultimate High-Magnification X-ray Inspection System at SMTAI 2011
5 Watt MR1605WH-V2AN LED Lamp with driver From GlacialLight

Nordson DAGE to Highlight the Industry’s Ultimate High-Magnification X-ray Inspection System at SMTAI 2011

Nordson DAGE, will showcase its XD7600NT Diamond X-ray inspection system in Booth #301 at the upcoming SMTA International Conference & Exhibition, scheduled to take place October 18-19, 2011 at the Fort Worth Convention Center in Fort Worth, Texas.

The Nordson DAGE XD7600NT Diamond X-ray inspection system utilizes the latest technology, flat panel detector and proven feature recognition capability to provide the ultimate choice for the highest quality in X-ray imaging on the market today. Equipped with the unique Nordson DAGE NT maintenance-free, sealed transmissive X-ray tube, providing 100 nanometer (0.1 µm) feature recognition and up to 10 watts of power, together with the 3 mega pixel long lifetime CMOS flat panel detector, the XD7600NT Diamond is the crystal clear choice for the greatest performance and highest magnification of real-time imaging.

At the show, Nordson DAGE also will demonstrate its µCT 3D modeling and volumetric measurement ideally suited for analytical investigation of critical applications such as stacked die, MEMS, PiP and PoP devices.

Keep Up to Date with the Most Important News

By pressing the Subscribe button, you confirm that you have read and are agreeing to our Privacy Policy and Terms of Use
Previous Post

ASSET's new FPGA-controlled test (FCT) inserts and operates a board-tester-in-a-chip

Next Post

5 Watt MR1605WH-V2AN LED Lamp with driver From GlacialLight