“The NI Automated Test Summit brings together a real-time global audience that covers every conceivable industry associated with electronics test,” said Jean-Yves Allard, Vice President of Research and Development for Averna. “As an exhibitor, we interact live with booth visitors from four continents at the same time. The balance of technical presentations coupled with the latest offerings from the exhibitors provides a valuable forum for all participants – and they don’t even have to leave their desks.”
Representatives from leading test and measurement companies worldwide such as Averna, Cal-Bay, Intel, Microsoft and Tektronix will share their technical expertise and best practices in sessions during the event. NI Business and Technology Fellow Mike Santori will present the keynote “Optimising Efficiency in Test.” Session themes include:
• Reducing software development cost
• The latest trends in hardware design
• Extending the life of your test system
• Test engineering panel discussion