Analysis

Keysight, OPPO collaborate for 5G test laboratory

30th September 2019
Mick Elliott
0

Keysight Technologies has established a joint 5G test laboratory in Shenzhen, China with OPPO, a world top five mobile device manufacturer, further extending the collaboration between the two companies.

The new lab uses Keysight's 5G platform to help verify the performance of new 5G new radio (NR) design to help the Chinese-based smartphone manufacturer expand its global market presence. Keysight's solutions enable OPPO to comprehensively test their 5G multi-mode devices in different form factors. "By setting up a joint 5G test lab with Keysight, we're strengthening our ability to successfully launch 5G devices for deployment in a wide range of 5G use cases," said Donny Peng, assistant vice president of Software Product Engineering in OPPO. "The extended collaboration with Keysight reflects the confidence we have in the company's 5G test solutions and the expertise they offer in helping us develop reliable 5G technology."

Chipset manufacturers and their mobile device ecosystems use Keysight's 5G NR platform, which is compliant to the latest 3GPP 5G NR standards.

The platform supports both sub-6GHz and mmWave frequencies for conducted and over-the-air (OTA) testing. Common development tools enable users to share design insights gained across each stage of the device lifecycle.

As a result, chipset and device manufacturers can accelerate delivery of new 5G NR products to market and capitalise on early commercial revenue opportunities.

"Leading 5G device makers such as OPPO recognise the importance of robust testing prior to successful and competitive commercial product launches in a global marketplace," said Kailash Narayanan, vice president and general manager of Keysight's wireless test group. "This joint lab is a key milestone in our 5G collaboration with OPPO to help them deliver on their 5G strategy and bring leading 5G devices to the market."

Featured products

Upcoming Events

No events found.
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier