Keithley Online Seminar Teaches Techniques for Making Error-Free Low I and High R Measurements

Fundamental techniques include choosing the appropriate instrumentation and cabling, as well as making the proper connections to the device. Measuring the offset current and determining the noise floor of the entire system are described in detail. Some of the many techniques and sources of error discussed include using appropriate settling time, electrostatic interference and shielding, leakage current and guarding, sources of external offset currents, and others.

Presented by Senior Staff Applications Engineer Mary Anne Tupta, the seminar is recommended for engineers, researchers, physicists, universities, and companies who need to make low current or high resistance measurements on devices and materials.