Attendees will learn how JTAG/Boundary Scan test methods can be used for not only structural testing but also as an adjunct to functional test using the PXI platform. The seminars will include technical demonstrations of JTAG/Boundary Scan tools and Functional Test development software and hardware.
Engineers, who are interested in the topics of Design for Test, PXI and functional test, or already utilize Boundary Scan PCB testing equipment as well as parties involved in test and validation are invited to attend. Attendees will learn how to maximize DFT capabilities and optimize overall test strategies. Demonstrating the integration of Functional Test and Boundary Scan PXI instrumentation and software, the workshops will illustrate how to enhance test coverage using Boundary Scan and how to configure and build Functional Test Systems using PXI.