Seminar participants will learn about common characterization and measurement techniques for a variety of established and emerging NVM technologies, including flash, PRAM, ReRAM, and FeRAM. This webinar will also provide an overview of instrumentation that combines pulse source and measurement in a single instrument that measures the current and voltage simultaneously while applying multi-pulse waveforms to a memory device or material.
This webinar is recommended primarily for NVM test engineers, researchers, and test engineering managers, but it will be useful for any engineer or researcher/student in the NVM field.
Alex Pronin, the seminar presenter, is a Lead Applications Engineer at Keithley Instruments, Inc. in Cleveland, Ohio, which is part of the Tektronix test and measurement portfolio. Alex holds a Master’s Degree in Physics from the Moscow Institute of Physics and Technology and a Ph.D. in Material Science from Dartmouth. He has been with the company since 1996.