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Free Keithley Web-Based Seminar ExploresTechniques for Characterizing Non-Volatile Memory

11th November 2011

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Keithley Instruments will broadcast a free, web-based seminar titled “Non-Volatile Memory – Characterization and Measurement Techniques on Thursday, November 17, 2011. To register for this one-hour seminar, visit http://www.keithley.info/NonVolatileMemory. Efforts to develop alternative non-volatile memory (NVM) technologies to floating gate NAND flash memory are currently underway, such as phase-change memory (PCM/PRAM), ferro-electric memory (FeRAM), magneto-resistive memory (MRAM), and resistive memory (ReRAM). Advanced characterization capabilities are critical to the success of any new technology. Despite the variety of memory technologies now in development, all of them share the need for the same type of characterization, such as transient switching behaviour, endurance, and the need for dynamic current measurement.

Seminar participants will learn about common characterization and measurement techniques for a variety of established and emerging NVM technologies, including flash, PRAM, ReRAM, and FeRAM. This webinar will also provide an overview of instrumentation that combines pulse source and measurement in a single instrument that measures the current and voltage simultaneously while applying multi-pulse waveforms to a memory device or material.

This webinar is recommended primarily for NVM test engineers, researchers, and test engineering managers, but it will be useful for any engineer or researcher/student in the NVM field.

Alex Pronin, the seminar presenter, is a Lead Applications Engineer at Keithley Instruments, Inc. in Cleveland, Ohio, which is part of the Tektronix test and measurement portfolio. Alex holds a Master’s Degree in Physics from the Moscow Institute of Physics and Technology and a Ph.D. in Material Science from Dartmouth. He has been with the company since 1996.