Aimed at chip designers, technology developers, wafer foundries and EDA tool vendors, the conference will explore the real impact of CMOS variability and how it can be managed at 45nm and below. Sessions presented by world leading experts will introduce the issues, discuss the options and share techniques for meeting the challenges of CMOS variability head-on.
Conference will show how to manage CMOS Variability
The National Microelectronics Institute (NMI), the trade association representing the semiconductor industry in the UK and Ireland, in collaboration with the UK’s nanoCMOS Consortium, has announced it is to host its second international conference on CMOS variability. ICCV 2009 “Living with Variability” will take place 12-13th May 2009 at the IET’s Savoy Place, London.