CMOS variability conference hailed a success

5th November 2007

ES Admin

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Europe’s first international conference dedicated to the subject of CMOS variability was hailed a resounding success by its organisers, the National Microelectronics Institute and the UK’s nanoCMOS project. ‘The Impact of Variability on Design’, attracted 130 delegates from across Asia, Europe and the USA.

Held at the Royal College of Physicians, London on the 23rd October, the event brought together world leading companies representing the complete semiconductor supply chain and major research initiatives to discuss the far reaching implications of variability on semiconductor design.

The conference was opened by a keynote address by Professor Asen Asenov, The University of Glasgow’s leader of the nanoCMOS project and a Government address by Rt. Hon. Stephen Timms MP, Minister for Competitiveness at the Department for Business, Enterprise and Regulatory Reform.

Derek Boyd, CEO of the NMI said, “The attendance at this, the first event of its kind and the very positive feedback we have received demonstrates the seriousness with which this major industry issue is being taken. We were also very pleased at the even split of research- and industry-based participants at the conference, which we believe creates a great platform for effective knowledge transfer in the sector.”