ADF is an open event at which designers of microwave and RF circuits and systems such as monolithic microwave integrated circuits, RF printed circuit boards and LTE communication systems can network and share useful information and resources pertinent to high-frequency design, discuss AWR products and technologies, and collaborate on industry issues and trends.
ADF presentations scheduled for Hitchin and Newbury in the UK and Paris and Rennes in France will be incorporated into the National Instruments/AWR RF and Microwave Design and Test Symposium.
Both ADF and Design to Test events are free, one-day seminars. ADF is a single track event focused on AWR software, whereas the NI/AWR RF and Microwave Design and Test Symposium offers attendees two tracks from which to choose—one track on RF/microwave design with AWR and the second on test and measurement with National Instruments.