ACD to Highlight Test Capabilities at DMC 2011

27th October 2011
ES Admin
ACD will highlight its test capabilities in Booth #316 at the upcoming Defense Manufacturing Conference (DMC), scheduled to take place November 28-December 1, 2011 at the Anaheim Convention Center in Anaheim, CA. As part of the company’s comprehensive service offering, ACD provides flying probe, boundary scan and functional test capabilities.
With single- and double-sided flying probe testers, ACD offers its customers confidence in receiving quality, defect-free assemblies. The company uses Acculogic ScanNavigator™ software, a powerful suite of both hardware and software tools specially designed for testing of electronic devices, boards and systems using the IEEE 1149.1 and IEEE 1149.4 standards. The test department also offers JTAG consultation and test coverage for designs that employ boundary scan components as well as in-system programming of programmable logic devices such as FPGAs and flash memories. Additionally, ACD’s functional testing verifies that each of the various product capabilities defined in the design specification or test specification meet their requirements.

ACD’s Project Coordinators work closely with the company’s test department and customers to obtain the necessary information to create an accurate test for each assembly. Based on this data, the test department endeavors to create the most comprehensive test possible. This test, in addition to visual quality control, ensures a very high level of quality.

All test programs are archived and available for use on subsequent builds at a later date. These programs also are available to any customers who may possess the same type of test equipment or have any other need for them.

ACD’s services comprise complete board layout services, ATE engineering services, DFM/DFA capability, printed circuit fabrication, component procurement, SMT and through-hole build, rework, X-ray, flying probe and functional test, and development.

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