Industries

UTAC and AEM to develop CMOS image sensor test systems

19th May 2020
Alex Lynn
0

UTAC and AEM have jointly announced a plan to collaborate and jointly develop the next-generation, cost-effective test system solutions for CMOS Image Sensor products.

Fuelled by the growing need in the fields of security, automotive safety, autonomous vehicles and industrial application, CMOS Image Sensor products are estimated to grow significantly for the foreseeable future. This is a focus growth area for UTAC. Through this partnership, UTAC and AEM are committed to participate in this growth market.

“UTAC has been offering CMOS Image Sensor assembly and test in Singapore for many years. Singapore is our Test Center of Excellence and we are excited to partner with AEM, another Singapore based company, to jointly work on developing this enhanced test solution. This collaboration demonstrates our commitment to provide next-generation, cost-effective full turn-key assembly and test solution for all our current and potential CMOS Image Sensor customers,” said Dr John Nelson, President and Chief Executive Officer of UTAC Group.

“This co-operation between AEM and UTAC, to create application specific test solutions will provide semiconductor companies with cost effective solutions that are scalable and adaptable for future product lines. This partnership also sets the foundation for increased co-operation and future growth for both companies and establishes AEM as a leader in semiconductor test and handling solutions,” added Chandran Nair, President of AEM Holdings.

Terence Gan, Senior Vice President and Head, Semiconductors, Singapore Economic Development Board, said: “We welcome UTAC and AEM’s partnership as a fine example of how innovation comes to life in Singapore’s vibrant semiconductor ecosystem. Such collaborations enable Singapore to harness the talents of both semiconductor manufacturers and local suppliers, and to remain as one of the world’s top semiconductor hubs.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier