First developed in the 1980s as the ‘poor man’s x-ray fluorescence spectrometer’, and primarily suitable for quantitative analysis for analysing a few simple sample matrices, ED-XRF analysers have undergone continuing and exciting technological development. Today, due to an ongoing march of generational improvements, ED-XRF devices provide the high-quality measurement of most elements in the periodic table from uranium to fluorine.
In the white paper, industry experts track the evolution of ED-XRF technology. The report compares the abilities of ED-XRF analyers to more expensive, complicated, and once-superior WD-XRF devices – and details the significant new benefits for users, including sensitivity and precision, cycle time and throughout, ease of use, compactness, and cost of ownership.
ED-XRF now offers effective solutions for a wide array of both routine and challenging real-world analytical applications, including petrochemicals, chemicals, environmental and geological samples, clinker/cement/slag, cosmetics, food, pharmaceuticals, and many more.
The best new generation, high-performance ED-XRF (says spectro), analysers deliver a multi-elemental analysis of major, minor, and trace element concentrations with very good resolution, even in samples of unknown composition – liquid, powder, or solid. They require no external chilling equipment. Low-volume helium purging is used only when required for light elements in liquids and powders, with a vacuum system for solid samples.
In comparison, experts say that the most advanced ED-XRF spectrometer typically requires half the purchase price of a top-flight WD-XRF and is significantly less expensive in terms of ongoing operation and maintenance.
Follow the experts on the evolution of ED-XRF. Download the complete white paper, ‘Surprising New Capabilities of ED-XRF Technology’, now at https://go.spectro.com/whitepaper/en/xrf-surprising-capabilities.
