Articles from Multitest elektronische Systeme GmbH
Contactor combines advanced test features at high temperatures
<p><strong>cDragon from Cohu combines advanced test features at temperatures from -55 °C to +155 °C with best RF capabilities and an innovative pin design for highest test yield and low cost…
8 January 2019
est module boosts accuracy, enhances output
<p><strong>The next generation of its 6DOF gyro test module for singulated packages has been released by Multitest. It provides significant production benefits resulting in even lower cost of…
14 March 2018
Contactors test wafer level chip scale packages
<p><strong>By adding the Gemini Kelvin 050 for 0.5mm pitch contacting Multitest continues to address the expanding requirements of its customers for reliable interface solutions for testing…
6 March 2018
mmWave contactor proves worth in chipset application
<p><strong>The mmWave contactor from Multitest is a proven broadband production solution for RF applications up to 100GHz. In a presentation by Jeffrey Finder, Senior Product and Test…
3 November 2017
Cantilever design contactor delivers enhanced MCU testing
<p><strong>The recently launched MiCon contactor from Multitest leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPs</strong><strong>and…
8 August 2017
Contactor demonstrates electrical and mechanical performance
<p><strong>Multitest’s new 0.3mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did…
31 July 2017
Soak booster option cuts cost of test
<p><strong>An enhanced Soak Booster option has been added to Multitest’s MT9928 tri-temp handler. It cuts down the soak time by up to 50%. </strong><strong>With this development Multitest is…
13 July 2017
Sensor test solution passed for automotive applications
<p><strong>Having successfully passed all correlation tests on a customer test floor Multitest’s new InPressure HD system has been released to production testing sensors for an automotive…
11 May 2017
Four opt for new pick and place handler
<p><strong>Multitest says it has received multiple orders for the MT2168 XT tri-temp pick and place handler. No less than four global IDMs have chosen the MT2168 XT for their volume…
15 January 2017
Test module provides twin axis stimulation
<p><strong>A</strong><strong> new “Shaker” high g sensor test module has been developed by Multitest for the MT9928 platform. The module allows for twin axis testing in one stimulation on the…
20 December 2016
Handlers can now test devices smaller than 3x3mm
<p><strong>Multitest has expanded the package range to devices smaller than 3 x 3 mm for its pick and place handler platforms - the MT9510 and MT2168. As a result, the company says the MT9510…
5 November 2016
Fingerprint test sensor kit handed Chinese order
<p><strong>Multitest’s InStrip has been selected to be the platform of a set up for high parallel testing of fingerprint sensors in China. The solution relies on Multitest’s established and…
1 August 2016
Multitest ships first MT2168 XT pick and place handler
<p><strong>Multitest has shipped the first MT2168 XT tri-temp pick and place handler to a major IDM. It combines the architecture of the MT2168 ambient/hot handler with the level of…
12 July 2016
Conversion kit meets SOT23 packages test challenge
<p><strong>A high volume test handling solution for SOT23 packages has been introduced by Multitest. The innovative conversion kit design allows for tri-temp testing of SOT23 packages on the…
20 June 2016
Multitest to Discuss Solutions for Mobility during Annual Open House Week
Multitest announced that it will hold its annual Open House Week July 9-11, 2013. Daily tours of the Multitest Santa Clara, CA facility, located at 3021 Kenneth Street, will be held at 10 a.m.…
1 July 2013
Signal Integrity Engineer at Multitest to Present PCB Material Analysis at IEEE Semiconductor Workshop in San Diego
Multitest announces that Jason Mroczkowski, Signal Integrity Engineer, will present at the upcoming The IEEE Semiconductor Wafer Test Workshop in San Diego, CA. The presentation entitled,…
3 June 2013
Kelvin Contactor for High Power Applications Proves Performance
Multitest announces that its ecoAmp high power Kelvin contactor successfully passed a challenging evaluation for an automotive application at a European based IDM. The patent pending ecoAmp is…
7 May 2013
MT9510 contact unit holder shortens downtime of test cells
<p><strong>Multitest announces that the new Access+ contact unit holder for the MT9510 significantly shortens the downtime of the test cell. The Access+ CUH has been developed for quick and…
19 April 2013
Meet Multitest At Teradyne Users Group Conference 2013
Multitest has announced that it will present at the Teradyne Users Group Conference, scheduled to take place April 29-May 1, 2013 in Fort Worth, TX. Meet Multitest’s experts to learn more…
15 April 2013
Creating True Value With Multitest At VOICE 2013
Multitest will present at the VOICE conference, scheduled to take place April 23-25, 2013 at the DoubleTree by Hilton Hotel in San Jose, CA. Meet Multitest’s experts to learn more about the…
4 April 2013
Multitest Announces Survey Drawing Winner
Multitest congratulates the winner of its recent survey, Mr. Rafael Reyes. Among all survey participants, the company held a drawing for an iPad mini. From the survey, Multitest received very…
25 March 2013