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GOEPEL electronic articles

Displaying 21 - 40 of 206

Test and validation for 6th generation Intel Core processors

Test and validation for 6th generation Intel Core processors
The recently launched sixth generation Intel Core processors codenamed Skylake are now also supported with special model libraries for testing and validation. The libraries, called VarioTAP models, allow flexible execution of processor emulation tests using the processor’s native debug interface. 
4th December 2015

Model libraries simplfy MCU test process

Model libraries simplfy MCU test process
Specific VarioTAP model libraries for universal processor emulation for the XMC family of Infineon have been announced by Goepel electronics. The processor is reconfigured to provide design-integrated test and programming instruments via the native debug port. A respective VarioTAP model, as part of an extensive IP library, contains all relevant access information for the respective target processor.  
29th October 2015

Embedded system access theme prepared for UK show

Embedded system access theme prepared for UK show
A portfolio of technologies for testing, programming, validation, and functional verification at chip, board, and system level, under the umbrella of Embedded System Access (ESA) is being presented by Goepel electronics at the Electronics Design Show in Coventry (October 21-22). Visitors can find out all about the possibilities of JTAG/Boundary Scan.
17th September 2015


Boundary scan integrated into ICT platform

Boundary scan integrated into ICT platform
The availability of Boundary Scan integration into SPEA’s multi-core ICT (In-Circuit-Test) platform has been announced by Goepel. With the level of integration provided for the SPEA3030 ICT, execution of interactive Boundary Scan tests is now possible on all cores of the ICT (up to four). This results in maximisation of parallelism and productivity.
3rd September 2015

Software encryption feature protects FPGA IP

Software encryption feature protects FPGA IP
Support for the Advanced Encryption Standard (AES) for the 7 Series FPGAs has been announced by Goepel Electronics. The AES feature is designed for better protection against potential attackers and theft of intellectual property from within the FPGA. The Xilinx AES programmer by GOEPEL electronics is integrated into the standard JTAG/Boundary Scan software platform SYSTEM CASCON.
24th June 2015

AOI system option allows double-sided THT inspection for PCBs

AOI system option allows double-sided THT inspection for PCBs
GOEPEL electronics has expanded the configuration options for the AOI system THT-Line for double-sided inspection of THT assemblies. Besides the accumulating roller conveyor for work piece carriers now also tape transport is available, due to constantly increasing demand frrom users.
2nd June 2015

Test technology targets IoT devices

Test technology targets IoT devices
JEDOS (JTAG Embedded Diagnostics Operating System) is a new technology for embedded test of complex electronic designs introduced by Goepel Electronics. It has been developed in particular for diagnostic testing of devices for the Internet of Things (IoT). The system architecture offers a complete operating system that uses the natively integrated processor to execute embedded diagnostic functional tests in real time.
27th May 2015

Collaboration delivers pull-thru adapter

Collaboration delivers pull-thru adapter
The PXI 1149/VPC(x) is a pull-thru adapter, developed by a collaboration between Goepel Electronics and the Peak Group. It ensures outstanding signal quality in the interface between Goepel’s PXI/PXIe SCANFLEX Boundary Scan controllers and test fixtures. It completely eliminates the complication of any kind of manual wiring in the configuration of the interface.
4th May 2015

Solder inspection system debuts at Nuremberg event

Solder inspection system debuts at Nuremberg event
A variety of optical/X-Ray inspection and JTAG/Boundary Scan solutions will be demonstrated by GOEPEL electronics at the SMT/Hybrid/Packaging show in Nuremberg (May 5-7). Visitors will see how electronic manufacturing can be optimised, errors can be minimised and production costs can be decreased through significant innovations expected this year.
16th April 2015

I/O module enhances testability of assemblies

I/O module enhances testability of assemblies
GOEPEL electronics has added the SFX-5296LX, a next generation mixed signal I/O module to its JTAG/Boundary Scan hardware platform SCANFLEX. It offers a powerful solution to make even non-scannable partitions testable through boundary scan. This, for example, allows testing of assemblies with just one Boundary Scan IC.
16th April 2015

Extreme Testing

How Bit Error Rate Testing IP can help with verifying high-speed interfaces in production. By Hosea Busse, Applications Engineer, GÖPEL electronic.
27th March 2015

VarioTAP model libraries test Bay Trail processors

VarioTAP model libraries test Bay Trail processors
GOEPEL electronics has developed specific model libraries for testing and programming of Intel Bay Trail processors, which are part of the Intel Atom family. The libraries called VarioTAP models allow flexible execution of processor emulation tests using the native debug port. Users are now able to use the processor as an instrument for hardware design validation of prototypes as well as programming of Flash devices.
7th January 2015

Test software prepares for electronica launch

Test software prepares for electronica launch
GOEPEL electronics will arrive at the electronica exhibition in Munich next week to present AOI systems with a completely new system software named PILOT 6.The Focus will be comfortable and fast test program generation combined with maximum inspection safety and flexibility for the user.
6th November 2014

electronica to host PCI Express BERT extension demo

electronica to host PCI Express BERT extension demo
A new option for Bit Error Rate Test (BERT) of PCI Express compatible high-speed bus systems was launched at the International Test Conference in Seattle by Goepel Electronic. The option will also be demonstrated at the upcoming electronica exhibition which takes place in Munich (Nov 11-14).
23rd October 2014

Boundary scan I/O modules enhance test coverage

Boundary scan I/O modules enhance test coverage
GOEPEL electronics has launched the CION-LX Module/FXT96, a new Boundary Scan module with high functionality and dynamics for test of analogue, digital and mixed signals at the ITC International Test Conference 2014 in Seattle. The module allows the extension of Boundary Scan test to non scannable circuit components such as connectors, clusters or analogue interfaces.
21st October 2014

Emulation technology widens microcontroller coverage

GOEPEL electronic's Universal processor emulation with VarioTAP technology has been extended to cover the Tiva C series from Texas Instruments. The processor is reconfigured to provide design-integrated test and programming instruments via the native debug port. A respective VarioTAP model, as part of an extensive IP library, contains all relevant access information for the respective target processor.
16th October 2014

JTAG, AOI solutions readied for electronica showing

JTAG, AOI solutions readied for electronica showing
electronica will provide the platform for a wide range of optical and electrical measuring and testing technologies from GOEPEL electronic. Taking centre stage will be the AOI division, represented by two systems: the solution for high-end inspection in large scale production which bears the name TurboLine. Double-sided inspection without assembly turning and rotatable angled-view are the factors for an even faster testing.
10th October 2014

FPGA test upgrade eliminates need for probes

GOEPEL electronics has extended the availability of ChipVORX model libraries for the XILINX ARTIX 7 FPGA series to support embedded test and embedded programming. ChipVORX is a technology for universal control of Chip Embedded Instruments via JTAG port. The special ChipVORX models are modular IP (Intellectual Properties), which contain all relevant access information of the target FPGA and are part of a comprehensive IP library.
28th September 2014

Test solutions on parade at electronica India

Test solutions on parade at electronica India
GOEPEL electronics will showcase complete solutions for electrical test at this year’s electronica India trade show in Bangalore (Sept 23-25). Key focus is laid on Embedded System Access (ESA) technology. As part of it, GOEPEL electronic will present the ESA Coach, a special evaluation and training kit supporting the ESA technology.
3rd September 2014

Emulation technology extended to cover TI Hercules MCUs

GOEPEL electronics says that the VarioTAP technology for universal processor emulation has been extended to cover Texas Instruments TMS570LSxx Hercules microcontroller family. The processor is reconfigured to provide design-integrated test and programming instruments via the native debug port.
31st July 2014


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