Engineers can use the digitizer with LabVIEW and the LabVIEW Jitter Analysis Toolkit, which provides a library of functions optimized for performing the high-throughput jitter, eye diagram and phase noise measurements demanded by automated validation and production test environments.
“The combination of high-speed, high-channel and high-resolution measurements offered by the NI PXIe-5162 digitizer makes it possible for traditional oscilloscope customers to think beyond traditional box instruments for automated test,” said Steve Warntjes, NI director of modular instruments research and development. “Using our high-speed digitizers with the LabVIEW Jitter Analysis Toolkit helps engineers accelerate their measurement systems using the processing power of modern PCs instead of the legacy embedded processors on box oscilloscopes.”
NI PXIe-5162 Features:
· 10 bits of vertical resolution for greater insight into the signal.
· Four channels in a single 3U PXI Express slot, expanding to 68 channels in a single PXI chassis.
· 5 GS/s maximum sample rate on one channel or 1.25 GS/s on four channels simultaneously.
LabVIEW Jitter Analysis Toolkit Features:
· Built-in functions for clock recovery, eye diagram, jitter, level and timing measurements.
· Example programs for eye diagram and mask testing, and random and deterministic jitter (RJ/DJ) separation using both dual-Dirac and spectrum-based separation methods.
The NI PXIe-5162 digitizer is priced from $12,999 (USD).
