Presented by Keithley’s RF specialist Mark Elo, the workshop will look at the challenges associated with verifying the performance of the physical layer of an LTE radio, including a review of OFMD/MIMO essentials and how they relate to the LTE PHY layer. The workshop will conclude with a range of practical examples and experiments, including innovative measurement techniques for Gain Compression, Frequency/Time EVM analysis and Channel/Stream manipulation.
The workshop is designed as a platform to exchange thoughts with the RF community, and attendants are actively encouraged to ask questions and to discuss their applications and test solutions.
Keithley Instruments addresses the ongoing convergence of wireless telecommunications with wireless data communications through innovative solutions for the testing of multiple radio, multiple standard, and multiple antenna commercial devices and infrastructure. To see the most advanced, award-winning innovations in RF/Wireless test, visit Keithley at EuMW 2009, Stand #327C.