Micros

Complete code control for Renesas RX MCU-based applications

25th April 2017
Enaie Azambuja
0

IAR Systems has announced a version of its industry-leading development tools for Renesas RX, adding support for the runtime analysis tool C-RUN. This addition completes the code analysis capabilities in IAR Embedded Workbench for Renesas RX, which previously has support for the static analysis tool C-STAT. Using C-RUN and C-STAT with IAR Embedded Workbench for Renesas RX enables complete code control through the entire development cycle.

C-RUN performs runtime analysis by checking application execution directly within the development environment. It features arithmetic checks, advanced bounds checking, and heap checking. As for C-STAT, C-RUN is completely integrated in the IAR Embedded Workbench IDE. Thanks to this tight integration, developers get up and running quickly with the analysis.

“The new version of IAR Embedded Workbench for Renesas RX delivers complete code control possibilities to the desk of every developer,” says Micael Borgefeldt, Product Manager, IAR Systems.

“C-RUN and C-STAT enable developers to add code analysis early in the development cycle and minimise the impact of software errors. Just like C-STAT, C-RUN is natural extension of our compiler and debugger technology. This tight integration allows developers to simply select the desired checks, rebuild the project, run it in the debugger and get instant feedback on the quality of their code.”

IAR Embedded Workbench for Renesas RX provides a complete integrated development environment (IDE) including the IAR C/C++ Compiler with Renesas RX ABI compliance, an assembler, a linker and the C-SPY Debugger. Version 3.10 of the toolchain adds an updated IDE that brings boosted user experience and improved workflows to developers worldwide. More information about IAR Embedded Workbench for Renesas RX is available at www.iar.com/iar-embedded-workbench/tools-for-rx. C-RUN is available as an add-on product.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier