Test & Measurement

JTAG software integrated into digital test instruments

3rd December 2014
Mick Elliott
0

The Corelis ScanExpress software for JTAG/boundary-scan test support is now integrated into Teradyne Di-Series high-performance digital test instruments (DTI). Di-Series instruments are VXI-compliant and widely used in existing and new Automatic Test Equipment (ATE) installations.

Using Teradyne’s Boundary Scan Runtime Library (TERBSR), Corelis ScanExpress tools can utilise a Di-Series instrument as a JTAG TAP controller, eliminating the need for additional JTAG hardware in the system.

The ScanExpress software includes a Graphical User Interface (GUI) for operator test control as well as an Application Programming Interface (API) for further automation and integration with test execution environments.

"Many of our customers in the aerospace and defence industry make use of Teradyne Di-Series modules in ATE systems including Spectrum 9100, LMSTAR, eCASS, NGATS, and more as part of their standard test platform," explains Senior Technical Marketing Engineer Ryan Jones. "These systems can now be upgraded to execute advanced boundary-scan tests, taking full advantage of Corelis’ advanced diagnostics with no additional hardware requirements, saving cost and effort." Teradyne Di-Series integration is included at no additional charge with Corelis ScanExpress Tools version 8.0 and later.

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