Test & Measurement
O/E modules address optoelectronic device testing up to 110GHz
The MN4765B series of O/E modules for Anritsu’s MS4640B VectorStar Vector Network Analyser (VNA) family creates a cost-effective and flexible solution for measuring 56Gb/s components and transceivers used in telecommunications and data communications applications. The module, combined with the VNA, provides a simplified approach for optoelectronic measurements and is an economical alternative to conventional total-system approaches currentl...
ECOC 2015: Industry leaders demonstrate 400G Ecosystem
Four industry leaders have collaborated to demonstrate the industry’s first commercially available Research & Development platform for testing single-carrier coherent optical communication systems and components operating at 56GBaud and beyond at ECOC 2015 in Valencia, Spain.
Receiver/oscilloscope combo tests optical signals at 130Gbaud
The IQS series of Coherent Optical Receivers extends Teledyne LeCroy’s Optical Modulation Analysis (OMA) portfolio, enabling the creation of flexible, modular systems. When combined with Teledyne LeCroy’s LabMaster 10Zi-A oscilloscopes and integrated Optical-LinQ analysis software, the IQS receivers test DP-QPSK and DP-16QAM optical signals at speeds up to 130GBaud.
Test set integrates BERT and sampling oscilloscope
The BERTWave MP2100B is an all-in-one test set from Anritsu with integrated BERT and sampling oscilloscope for developing and manufacturing Optical Modules. The test set is successor to the company’s MP2100A and provides more efficient evaluation of multichannel Optical Modules. Data Centres are urgently increasing the transmission capacity of their servers and network devices to meet the exploding demand for Cloud Computing services.
Software accelerates semiconductor test process
A major system software update (KTE version 5.6) for the Keithley S530 Parametric Test System that can reduce measurement speed by as much as 25 percent has been released by Tektronix. This translates into increased wafer-level test throughput and directly improves the S530’s cost of ownership (COO) for semiconductor production and R&D departments.
Strain gage bundle is designed for 400°C
To meet the growing demand for precise and reliable strain gages and accessories operating in harsh environments, Micro-Measurements, a Vishay Precision Group (VPG) brand, has announced that it has launched a new strain gage bundle designed for high-temperature applications above 400°C.
LCR meter covers 20Hz to 300khZ frequency range
A 300kHz bench LCR meter, the 891, has been unveiled by B&K Precision. The compact, value-priced LCR meter can measure inductance, capacitance, and resistance with 0.05% best impedance accuracy over a fully adjustable test frequency range of 20Hz to 300kHz. With a 300-point linear and logarithmic sweep function, bin comparator, and versatile remote control interfaces, the 891 is suitable for characterising components in laboratory, quality co...
Data acquisition system upgraded with bridge measurement
A host of upgrades has been added to Brüel & Kjær’s data acquisition and analysis system - PULSE 20. These include a versatile bridge measurement tool for industries ranging from aerospace and defence to industrial and automotive.
Micro-ohmmeter has wide ranging test capabilities
The DO5000 series of micro-ohmmeters from Cropico are in stock at Seaward. The instruments offer increased flexibility for the highly accurate measurement of resistance values in a variety of electrical manufacturing, electronic component testing and equipment calibration applications.
Tunable laser sources expand spectral test options
The 81607A, 81608A and 81609A tunable laser sources are a range of modules for the Keysight 8164B lightwave measurement system. The modules extend the product family that debuted in March 2015 with the 81606A tunable laser source, an instrument with sub-picometer tuning repeatability and wavelength accuracy that is maintained even in full-speed, two-way sweeps.