Test & Measurement

Agilent Technologies has developed a power device capacitance analyser that automatically characterises power device junction capacitances using real operating voltages. With the increasing use of power devices fabricated from emerging materials like SiC and GaN, switching power supplies are now operating at increasingly higher frequencies.

Visibility into the operations and data stored on circuit boards and in semiconductors is the goal of test and debug. Unfortunately, this is often at odds with the goals of circuit board security. A new eBook published by ASSET InterTech addresses the inherent weaknesses in the IEEE 1149.1 Boundary-Scan (JTAG) standard’s Test Access Port (TAP) found on many circuit boards and chips.

GOEPEL electronic has extended the AFPG (Automated Flash Program Generator) to support all ISP options (In-System Programming) in one tool. The AFPG is a tool for the automatic generation of scripts for universal in-system programming of non-volatile memory such as flash devices, and also microcontrollers with integrated flash, via boundary scan.

A battery-powered speech sound source, designated the Echo Speech Source Type 4720, has been launched by Bruel & Kjaer. The device enables users to measure acoustics within any room or space, make comparisons between one room and another, validate sound systems and perform scale model measurements.  

Teledyne LeCroy’s new WaveSurfer 3000 series of oscilloscopes feature the MAUI advanced user interface,previously available only on higher-end oscilloscopes. It seamlessly integrates a deep measurement toolset and multi-instrument capabilities into a cutting edge user experience centered on a large 10.1in touch screen, the largest display and only touch screen in this class of oscilloscope.

Data Translation’s DT9626 USB data acquisition series features a 24-bit A/D resolution and a high measurement accuracy along with all the advantages of a dedicated A/D converter for each channel as well as galvanic isolation. The modules are available with 4, 8 or 16 analogue inputs, each providing sampling rates of up to 41.6 kHz.

Semiconductor companies developing DDR controller IP, those developing DRAM chips and DIMMs, and OEMs integrating the controller and DIMM into a system using PCB technology can now use Agilent Technologies’ Advanced Systems DDR4 Compliance Test Bench for a complete workflow from simulation of a candidate to measurement of the finished prototype.

The HAMEG Instruments range of economical, general purpose instruments will now be marketed solely under the Rohde & Schwarz brand. It is a move designed to raise the international profile of the test and measurement products. Previously, the HAMEG products had a dual logo that included the company names Rohde & Schwarz and HAMEG.

Earlier this year, GOEPEL electronics announced a significant increase in testing speed for the high-end AOI system TurboLine. Innovative solutions of image capturing technology and test program execution in combination with massive use of angled-view inspection could reduce the test time up to 50%.

Advantest has announced its new T2000 Enhanced Device Power Supply 150A (DPS150AE) module that enables its T2000 test platform to handle the load requirements for highly accurate testing of both high-current and low-voltage semiconductors, including microprocessor units (MPUs), application-specific ICs (ASICs) and field-programmable gate arrays (FPGAs).