Test & Measurement
Software enhances 5G development process
SignalVu software has been implemented on the Tektronix family on its family of DPO70000SX ATI Performance Oscilloscopes. This will allow researchers and others engaged in developing next generation wide- and ultra-wide bandwidth technologies such as 5G, cellular backhaul and radar to perform RF modulation measurements with unprecedented margins of error.
PAM analysis solution operates on 70GHz oscilloscope
A comprehensive set of analysis tools for emerging PAM4 modulation measurement needs with full support for both optical and electrical interfaces has been introduced by Tektronix. The new tools operate on both DPO70000SX 70GHz real time and DSA8300 equivalent time oscilloscopes, ensuring that no matter which instrument configuration is needed for a particular application, the correct results will be delivered with the highest degree of accuracy.
Test solution speeds development of IEEE 802.3bm-related technologies
The publication of the IEEE 802.3bm specification is enabling broad market acceptance of lower-cost 100G optical products. Tektronix is responding with a fully automated Transmitter Dispersion Eye Closure (TDEC) measurement and 100GBASE-SR4 conformance test solution that will make the complex process of ensuring that new product designs conform to this optical specification faster, easier.
O/E modules address optoelectronic device testing up to 110GHz
The MN4765B series of O/E modules for Anritsu’s MS4640B VectorStar Vector Network Analyser (VNA) family creates a cost-effective and flexible solution for measuring 56Gb/s components and transceivers used in telecommunications and data communications applications. The module, combined with the VNA, provides a simplified approach for optoelectronic measurements and is an economical alternative to conventional total-system approaches currentl...
ECOC 2015: Industry leaders demonstrate 400G Ecosystem
Four industry leaders have collaborated to demonstrate the industry’s first commercially available Research & Development platform for testing single-carrier coherent optical communication systems and components operating at 56GBaud and beyond at ECOC 2015 in Valencia, Spain.
Receiver/oscilloscope combo tests optical signals at 130Gbaud
The IQS series of Coherent Optical Receivers extends Teledyne LeCroy’s Optical Modulation Analysis (OMA) portfolio, enabling the creation of flexible, modular systems. When combined with Teledyne LeCroy’s LabMaster 10Zi-A oscilloscopes and integrated Optical-LinQ analysis software, the IQS receivers test DP-QPSK and DP-16QAM optical signals at speeds up to 130GBaud.
Test set integrates BERT and sampling oscilloscope
The BERTWave MP2100B is an all-in-one test set from Anritsu with integrated BERT and sampling oscilloscope for developing and manufacturing Optical Modules. The test set is successor to the company’s MP2100A and provides more efficient evaluation of multichannel Optical Modules. Data Centres are urgently increasing the transmission capacity of their servers and network devices to meet the exploding demand for Cloud Computing services.
Software accelerates semiconductor test process
A major system software update (KTE version 5.6) for the Keithley S530 Parametric Test System that can reduce measurement speed by as much as 25 percent has been released by Tektronix. This translates into increased wafer-level test throughput and directly improves the S530’s cost of ownership (COO) for semiconductor production and R&D departments.
Strain gage bundle is designed for 400°C
To meet the growing demand for precise and reliable strain gages and accessories operating in harsh environments, Micro-Measurements, a Vishay Precision Group (VPG) brand, has announced that it has launched a new strain gage bundle designed for high-temperature applications above 400°C.
LCR meter covers 20Hz to 300khZ frequency range
A 300kHz bench LCR meter, the 891, has been unveiled by B&K Precision. The compact, value-priced LCR meter can measure inductance, capacitance, and resistance with 0.05% best impedance accuracy over a fully adjustable test frequency range of 20Hz to 300kHz. With a 300-point linear and logarithmic sweep function, bin comparator, and versatile remote control interfaces, the 891 is suitable for characterising components in laboratory, quality co...