Test & Measurement
High-speed data connectors debut at Automated Test Summit
The latest developments in automated test systems as well as test solutions using mass interconnect products from Virginia Panel Corporation (VPC) will be featured by The Peak Group, a National Instruments Alliance partner, at the NI Automatic Test Summit. To be premiered at the event is a range of VTAC high-speed data (HSD) connectors for the VPC mass interconnect systems.
Signal and spectrum analyser delivers faster measurement speeds
High measurement speeds are crucial for production testing of wireless communications components and base station test systems. That’s why Rohde & Schwarz developed its new FPS signal and spectrum analyser specifically for these types of automated measurement applications. At just two height units (2 HU), the compact FPS takes up only half as much rack space as a conventional spectrum analyser.
Modulated RF analysis enhanced in simulation software
The latest version of Agilent Technologies Genesys RF simulation and synthesis software features breakthrough modulated RF analysis as well as enhancements to its custom-filter direct synthesis technology. Genesys 2014 enables designers to simulate digitally modulated RF signals like those found in today’s defence and consumer wireless applications as easily as they do traditional analogue RF signals.
Platform tests analogue, mixed-signal, sensor ICs
An evolutionary value-added platform that combines digital and analogue testing capabilities to handle small-pin-count analogue, mixed-signal and sensor semiconductors has been unveiled by Advantest. The EVA100’s expandable architecture provides the flexibility to conduct a wide range of measurement functions.
USB data acquisition module features 32 analogue inputs
A new USB data acquisition module from Data Translation comes with 32 analogue inputs, a 1 MHz A/D converter and 20-bit A/D resolution. The DT9844 is designed to provide high throughput and high accuracy for a large number of channels. Even at the maximum overall sampling rate of 640 kHz, the module achieves an outstanding system accuracy and minimises noise and crosstalk. In addition to the 32SE or 16DI analogue inputs, the module also features ...
Analyser adds focus to DDR performance characteristics
Providing designers with a suite of automated DDR analysis, visualisation and debug tools, the UniquiPHY DDR System Analyser (DSA) is a comprehensive software package. The analyser complements its adaptive PHY technologies, dynamic self-calibrating logic (DSCL) and dynamic adaptive bit calibration (DABC), by giving the DDR design team a powerful, automated analysis and debug tool that interacts directly with the UniquiPHY DDR PHY.
PCIe digitisers enhanced with averager capability
Keen to add another layer of versatility to its PCIe digitiser family, Agilent Technologies has introduced a new averager real-time processing function. Averaging signals reduces random noise effects, which improves the signal-to-noise ratio and increases resolution and dynamic range. The fast sampling rate of up to 3.2 GS/s is achieved with a single trigger and acquisition, and does not require the use of equivalent-time sampling techniques.
Open source test instrument in production
RS Components (RS) is taking general orders for Red Pitaya, the single-board, open instrumentation and control platform. Prospective buyers who previously registered their interest on the Red Pitaya website, and who have been awaiting availability of the product, were given the opportunity to place a priority order with RS, which guarantees them delivery of a Red Pitaya board from the first limited production run in May 2014.
WLAN design and validation supported by wireless test set
Agilent Technologies says that its EXM wireless test set now supports 4x4 True MIMO capability for WLAN design and validation, with up to four TRXs testing multiple-input, multiple-output antenna characteristics simultaneously. This capability further advances the gigabit era for WLAN evolution, especially the rapidly evolving 802.11ac technology.
Evaluation board taps potential of Tester on Chip
GOEPEL electronic’s CION LX Evaluation Board (EVB) is designed to demonstrate technical test capabilities of the CION LX circuit which is the world’s first JTAG controllable Tester on Chip (ToC).Using the Evaluation Board, users can verify all operating modes as well as develop their own applications and test scenarios.