Test/Measurement

Displaying 151 - 2931 of 2781

SoC electricity meter puts emphasis on accuracy

SoC electricity meter puts emphasis on accuracy
The ZON M3 (MAX71315) single-phase electricity meter SoC from Maxim Integrated Products offers engineers a highly accurate, low-cost design system for e-meters and solid-state meters. Automotive Superior metering metrology is essential for accurate monitoring and billing. Additionally, meter manufacturers must consider cost in their designs, as millions of meters are being deployed throughout the globe.
14th April 2014

USB data acquisition modules eliminate phase shifts

USB data acquisition modules eliminate phase shifts
With the DT9816 series Data Translation offers a range of low-cost USB data acquisition modules for simultaneous sampling of up to six analogue signals. Unlike comparable measurement instruments in the same price range, these modules feature separate 16-bit A/D converters per input channel instead of multiplexed inputs.
14th April 2014

E-book opens way to FPGA in-line, in-system programming

Programming memory on the manufacturing line after the devices have been soldered to a circuit board must be accomplished quickly to keep pace with the assembly process. Unfortunately, the capacity of flash has got so large and the amount of data being programmed into them so extensive that the process has slowed considerably.
14th April 2014


High-speed digital design topic for European symposia

Agilent Technologies is to stage a European symposium tour focused on high-speed digital design and test topics.  The complimentary full-day technology symposium for engineers and project managers will feature presentations from some of the leading providers of FPGA and memory devices. The symposia will be conducted in 12 cities across Europe, from May 20 to July 3.
14th April 2014

Strain gauges take centre stage at Sensor & Test

At the Sensor & Test in June VPG Micro-Measurments and Transducers will be showing the next generation strain gauges and the System 8000 StrainSmart data acquisition system. The strain gauges are produced on an advanced manufacturing technology line at its Micro-Measurements Advanced Sensors facility. This facility has the latest processing equipment, which is now providing replacement gages for many of M-M's existing transducer class products with tighter tolerances than the previous generation.
10th April 2014

Contactless card/mobile device tester makes market debut

Contactless card/mobile device tester makes market debut
Agilent Technologies and FIME, a secure-chip consulting and testing provider, today announced the availability of test systems based on the EMV Contactless Level 1 Specification for mobile payments. The test systems enable users to validate that a contactless payment card or mobile device achieves the required functionality and will perform as specified by EMV industry standards. This initial release is now available to purchase as an off-the-shelf product for in-house testing.
9th April 2014

Test platform passes rigorous NFC approval process

Test platform passes rigorous NFC approval process
COMPRION’s UT³ Platform has recently been approved by the NFC Forum for Digital Protocol Functional Testing and is now listed on their website in the Approved Test Tool section. After a rigorous validation procedure the solution can be used by manufacturers for NFC Forum conformance testing as well as by authorised laboratories for certification testing of NFC Forum devices.
9th April 2014

Test scope accreditation first for automotive Ethernet

RUETZ SYSTEM SOLUTIONS has become the first test house successfully accredited for test scopes for automotive Ethernet and Protocols through the German accreditation body DaaKs (Deutsche Akkreditierungsstelle, Berlin). In their own compliance laboratory, the automotive data communication specialists now perform test scopes for automotive Ethernet and Protocols according to DIN EN ISO/IEC 17025.
9th April 2014

8x8mm aperture extends transducer options

8x8mm aperture extends transducer options
LEM has added three new members to its HO series of PCB-through-hole mounting current transducers, which provide an aperture of 8 x 8 mm to carry the primary conductor under measurement, extending the options for this form-factor. The new models, for 6, 10 or 25 A nominal measurements of DC, AC, and pulsed signals benefit from the revised LEM Open-loop Hall-effect ASIC (Application Specific Integrated Circuit) introduced several months ago with the launch of the HO 8, 15 and 25-NP & –NSM models.  
7th April 2014

Windows-based app upgrades debug and test capabilities

Micrium, represented in Germany by Embedded Office has released µC/Probe, Graphical Live WatchV.32. µC/Probe is a Windows-based application that allows engineers to graphically visualise and change the behaviour of embedded systems at run-time. µC/Probe can read from and write to the memory (or I/O) of just about any embedded processor during run-time, and represent those values as a graphical objects: gauges, meters, numeric indicators, LEDs, sliders, graphs, and many more.
7th April 2014


Test/Measurement documents


Network Headlines

The source for EOL devices

Sign up to view our publications

Sign up

Sign up to view our downloads

Sign up

 

WEBENCH® Designer