Test & Measurement

Displaying 151 - 160 of 3942

Test solution meets ONFI flash memory standard

Test solution meets ONFI flash memory standard
What is claimed to be the industry’s first test solution for the Open NAND Flash Interface (ONFI) standard is available for Tektronix high-performance oscilloscopes. The ONFI 4.0 test solution includes software for analysing DDR2/3 modes on the ONFI bus coupled with an effective probing solution based on interposers.
2nd November 2016

DisplayPort Type-C transmitter test solution cuts compliance test times

DisplayPort Type-C transmitter test solution cuts compliance test times
A DisplayPort Type-C Transmitter Test solution significantly reduces compliance test times compared to both previous Tektronix DisplayPort solution and those available from competitors. According to real-world field evaluations, the highly optimised solution for use with Tektronix high-performance oscilloscopes allows engineers to complete the full suite of DisplayPort Type C compliance tests in less than 6 hours.
1st November 2016

100G link training tool added to scope's capabilities

A new 100G link training tool has been released for use with the Tektronix DPO70000SX family of ultra-high performance oscilloscopes. This new option, along with expanded measurement support for 100G electrical debug and validation, addresses critical needs in the growing data centre market.
1st November 2016


Signal analyser adds USB3.1 receiver test solution

Signal analyser adds USB3.1 receiver test solution
Anritsu’s MP1800A Signal Quality Analyser now supports the newest USB3.1 Gen2 receiver test standards. The USB3.1 Receiver Test Solution uses the G0373A Adapter and MX183000A High-Speed Serial Data Test Software to support both USB3.1 Gen1 (5 Gbit/s) and Gen2 (10 Gbit/s) receiver Jitter Tolerance tests.
31st October 2016

Portable signal scanning recorder boasts 30TB storage capacity

Portable signal scanning recorder boasts 30TB storage capacity
The Talon signal recording systems range from Pentek has a new addition. The RTR 2623 6 GHz RF Sentinel Intelligent Signal Scanning portable, rugged recorder combines and exploits the power of a Pentek Talon recording system with a fully integrated 6GHz RF down converter. The Sentinel capability adds intelligent signal scanning with real-time signal monitoring and detection that is fully user configurable.
27th October 2016

Fundamentals of power integrity measurement – part two

In part two of his article on power integrity measurement (view part one in the November issue of Electronic Specifier Design), Erik Babbé, Marketing Brand Manager for Oscilloscopes, Keysight Technologies, offers ten tips for better power supply measurement.
27th October 2016

Optimised system analysis tool for Infineon’s AURIX TC3xx MCU

Optimised system analysis tool for Infineon’s AURIX TC3xx MCU
By introducing version 4.7 of its Universal Debug Engine (UDE) at this year’s electronica trade show (hall A6, booth A16), PLS Programmierbare Logik & Systeme presents an optimised debug, test, and system analysis tool that fully supports the internal debug functionalities of Infineon’s new AURIX TC3xx multi-core microcontroller family without any limitation. The multi-core SoCs of the second AURIX generation were specifically designed for electric and/or autonomous vehicles.
27th October 2016

Parametric test solution targets power semiconductors

Parametric test solution targets power semiconductors
The Keithley S540 Power Semiconductor Test System, a fully-automated, 48 pin parametric test system for wafer-level testing of power semiconductor devices and structures up to 3kV has been released by Tektronix. Optimised for use with the latest compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated S540 can perform all high voltage, low voltage, and capacitance tests in a single probe touch-down.
25th October 2016

Training link helps debug data centre interconnects

Training link helps debug data centre interconnects
A new 100G link training tool has been released for use with the Tektronix DPO7000SX family of ultra-high performance oscilloscopes. This new option, along with expanded measurement support for 100G electrical debug and validation, addresses critical needs in the growing data centre market.
25th October 2016

3D sensor enables accurate ball-grid-array inspections

3D sensor enables accurate ball-grid-array inspections
Besides the inspection of the correct position of pins, the EyeScan AT 3D sensor - together with the EyeVision image processing software - can also check for the flawlessness and position of balls on a Ball-Grid-Array (BGA). The connectors of BGAs can be inspected with the 3D sensor for various characteristics up to an accuracy of a micrometer (µm).
25th October 2016


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