Test/Measurement

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High-speed digital symposium tour explores design through verification

High-speed digital symposium tour explores design through verification
Conducted in 10 cities across Europe, from May 20th through to July 3rd, Agilent Technologies has announced a European symposium tour focused on high-speed digital design and test topics. The full-day technology symposium for engineers and project managers is complimentary and will feature presentations from some of the leading providers of FPGA and memory devices.
4th April 2014

Disturbance analysis now standard on MXE EMI receiver

Disturbance analysis now standard on MXE EMI receiver
Agilent Technologies has added disturbance analyser capabilities as a standard feature of its N9038A MXE EMI receiver. For those who need to make discontinuous-disturbance, or click, measurements, the MXE simplifies and automates data collection, analysis and report generation in accordance with CISPR standards 14-1 (emissions) and 16-1-1 (measurement apparatus and methods).
3rd April 2014

PCB test and debug event slated for June 18 in Cambridge

The ‘ElectroTestExpo’ consortium has revealed the dates for its regional PCB test and debug exhibitions to be held during 2014.  Now enjoying its fifth consecutive year of free-to-attend events, ElectroTestExpo will commence its combination of drop-in tabletop exhibition and seminar on June 18th at one of the UK’s main electronics and research hubs – the Cambridge Science Park (the Trinity Centre).
2nd April 2014


Network analyser family bolstered by 8.5GHz model

Network analyser family bolstered by 8.5GHz model
Agilent Technologies has expanded its PNA-X family of network analysers with an 8.5 GHz model that more economically supports lower-frequency devices used in wireless communication applications (e.g., handsets, base stations, WLAN and other mobile communication devices). The new network analyser offers lower cost and frequency to bring advanced measurement capabilities to the cost-sensitive wireless communication device market.
2nd April 2014

Compact optical test platform offers many connectivity options

Compact optical test platform offers many connectivity options
EXFO has launched the FTB-2 ProCompact Platform, the industry's smallest platform for high speed, multi-technology and optical testing and the next generation in the FTB line of portable test platforms. The tester delivers a compact solution for high speed and multi-service testing as well as the power to field testing.
2nd April 2014

Test Debut: Anglia opens new market with Teledyne LeCroy

Test Debut: Anglia opens new market with Teledyne LeCroy
Anglia Components has taken its first step into the test and measurement distribution space. It has signed a deal covering the UK and Ireland with Teledyne LeCroy. Both companies see fertile ground in the engineering community where Anglia’s field applications team will identify opportunities for Teledyne LeCroy’s oscilloscopes and waveform generators. Anglia will hold an inventory that can be ordered via its Anglia Live website for next day delivery.
1st April 2014

PXI show offers platform for chassis and digitizer

PXI show offers platform for chassis and digitizer
ADLINK will showcase the PXES-2780 PXI Express Chassis and the PXIe-9852 High-Speed PXI Express Digitizer at The PXI Show (NEC, Birmingham, April 8-10). The ADLINK PXES-2780 is an 18-slot PXI Express chassis, compliant with PXI Express and cPCI Express specifications and offering one system slot, one system timing slot, ten hybrid peripheral slots, and six PXI Express peripheral slots for a wide variety of testing and measurement applications requiring enhanced bandwidth.
31st March 2014

Analog test system gets thumbs up at NFC Forum

Agilent Technologies has announced the successful validation of its T3111S NFC test system for NFC Forum Analog testing. During its members’ meeting in San Francisco, the NFC Forum confirmed that the Agilent T3111S is one of the first test tools approved for NFC Forum Analog testing. The validation house selected by the NFC Forum performed extensive testing, including comparisons using other candidates’ tools.  
31st March 2014

Tool suite verifies constrained, low-power embedded applications

LDRA is providing verification for highly constrained applications. By optimising its analysis and testing technology, LDRA has enhanced the ability of the LDRA tool suite to scale down to meet the increasing number of highly constrained, minimal-footprint architectures used in today’s safety-critical and security-critical applications.
31st March 2014

SDN/NVF validation test bed accelerates time to market

Spirent Communications' Spirent Velocity is a virtual lab environment that helps validate Software Defined Networks(SDN)/Network Function Virtualisation (NVF) technologies and deployments. It helps accelerate time to market and reduce expenses associated with traditional virtual and physical test beds.
31st March 2014


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