Test & Measurement

Displaying 151 - 3081 of 2931

Threaded probe travels 5.6mm, mounts at 4mm

Threaded probe travels 5.6mm, mounts at 4mm
Peak Test Services has added a new threaded long-travel probe to its range of spring-contact test probes for contacting printed-circuit boards in automatic test systems.  The new P61/G has a travel length of 5.6 mm nominal (7 mm maximum), and is designed for mounting at 4 mm (157 mil) centres. Current rating is 10 A, and typical resistance is 25 milliohms.
31st July 2014

Software supports P25 transmitter compliance testing

Software supports P25 transmitter compliance testing
A cost-effective compliance transmitter test solution for the Project 25 (P25) Common Air Interface (CAI) Phase 1 and Phase 2 standard has been introduced by Tektronix. The new software gives RF test engineers and safety agencies push-button measurements with automated pass/fail reporting and runs on Tektronix spectrum analysers, Tektronix Windows-based oscilloscopes, and on SignalVu-PC linked with the MDO4000B Mixed Domain Oscilloscope Series.
31st July 2014

Software integration offers seamless test environment

Vector Software says that its VectorCAST software test environment now offers an integration with the PTC Integrity application lifecycle management (ALM) platform. As a result, software developers can easily integrate the VectorCAST test results of their embedded software applications into one seamless environment that manages the end-to-end processes of development.
31st July 2014


Water level transducer collects half a million data points

Water level transducer collects half a million data points
A water level transducer suitable for harsh environments, has been introduced by Measurement Specialities. The battery-powered TruBlue 255 can collect up to half a million time stamped pressure and temperature data points with its standard 8MB of internal memory and 3.7m data points with its optional 56MB of internal memory.
31st July 2014

JTAG/Boundary Scan hardware interface stars at Autotestcon

JTAG/Boundary Scan hardware interface stars at Autotestcon
JTAG Technologies will be showcasing the new JTAG/boundary-scan hardware interface product compatible with the Virginia Panel (VPC) mass interconnect system at Autotestcon 2014 in St. Louis (Sept 15-18) The JT 2147/VPC is a signal conditional module that allows ‘ideal world’ connections from JTAG Technologies PXI and PXIe DataBlasters to the VPC connection system.
28th July 2014

Component model libraries offered free to new users

Agilent Technologies says that the Modelithics COMPLETE Library of RF and microwave component model libraries is available free of charge for six months to Genesys 2014 users new to Modelithics. The Modelithics COMPLETE Library contains Global Models that represent entire RLC component families as compact models with layout attributes, pad de-embedding capability, and offer scaling of part-value, substrate type and thickness, and solder pad geometries.
28th July 2014

Power semiconductor test platform meets JEDEC standard

Power semiconductor test platform meets JEDEC standard
An automated test system that meets the requirements of JEDEC standards and may be used for product development characterisation has been launched by Intepro. The system is a solution for reliability and extended lifetime testing of power semiconductors including IGBT, MOSFET, SCR, diode and bipolar parts and modules. The SemTest system is comprised of a test system, thermal oven and test software with optional chiller and cold plates.
28th July 2014

Digitising linear measurement for greater accuracy

A novel approach to digitally measuring analogue current could deliver greater accuracy at ultra-low powers. By Johann Zipperer & Peter Weber, Texas Instruments.
28th July 2014

Speed-to-answer - differentiating instrument design

Speed-to-answer - differentiating instrument design
Industry studies have recently highlighted significant changes in the test market, including shrinking product design cycles (down by 13% over the last three years) and fewer dedicated test engineers with in-depth T&M backgrounds. In fact, one in five electrical engineers now working started his or her career within the last decade. By Jonathan Tucker, Keithley Instruments.
25th July 2014

All-in-one transport tester solves network problems

All-in-one transport tester solves network problems
The new MT1000A Network Master Pro from Anritsu is an all-in-one optical network field tester that supports the multiple communications protocols used in today’s converged telecom networks. The tester is portable, compact and user-friendly and it is aimed at technicians who install and maintain mobile-access, fixed-access, metro and core transmission telecoms networks.
24th July 2014


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