Test & Measurement
DOCSIS 3.1 test setups aided by signal generator
Transmitting high-definition 4K UHD contents to consumers' households requires large bandwidths. Capacity requirements for IP based services are also on the rise. Enter new broadband technologies such as DOCSIS 3.1. The new DOCSIS 3.1 standard enables data rates of several Gbit/s for IP-based transmissions in cable networks. Rohde & Schwarz is offering the R&S CLGD signal generator for network component development and receiver tests.
RF analysers target spectrum monitoring applications
The NRA series of compact rack-mount RF analysers has been expanded by Narda Safety Test Solutions with the introduction of two new ‘RX’ models, which have been specifically designed for spectrum-monitoring applications. The analysers are ideal for short- and long-term observation of all types of RF signals, including pulsed and sporadic transmissions, and will attract oraganisations including communications authorities, broadcast com...
Spectrum analyser measures signals in real-time
A full-featured spectrum analyser designed to analyse wireless signals in real-time (not progressively scanned) has been unveiled by Saelig. The feature is essential for seeing intermittent and frequency-hopped signals. The RTSA7500 has all the standard features of a sophisticated, expensive bench-top spectrum analyser, but at lower cost as it uses a PC for the display and processing power.
Trigger/analysis options upgrade oscilloscopes
Trigger and analysis options have been added by Yokogawa to its DLM2000 (4-channel) and DLM4000 (8-channel) Mixed Signal Oscilloscopes (MSOs) for testing the latest generation of in-vehicle serial buses. The options are specifically designed to address the measurement challenges posed by the CAN FD (CAN with Flexible Data Rate) and SENT (Single Edge Nibble Transmission) bus systems.
Current probes supply measurements down to 1 mA/div
The CP030A and CP031A high sensitivity current probes from Teledyne LeCroy provide sensitivity down to 1mA/div allowing users to measure current from the mA range up to a continuous current of 30Arms and peak current of 50A all with the same probe. The probes provide a small form factor for today’s crowded boards.
Universities to benefit from wireless lab solution
A wireless lab instrument management solution for quickly setting up and efficiently managing basic electronics engineering laboratories at colleges and universities is available from Farnell element14. The Tektronix TekSmartLab TSL3000A solution supports up to 120 instruments (30 test benches) on a single platform.
Cooled cameras cope with demanding applications
Three new science-grade thermal cameras, the A6200sc NIR, A8300sc HD MWIR, and A6700sc LWIR** have been unveiled by FLIR Systems. Designed for demanding science and research, the applications include electronics development, university research, and non-destructive testing. The cooled cameras deliver exceptional image quality, standardised interfaces and MATLAB integration making them powerful, efficient tools for gathering thermal data.
I/O module enhances testability of assemblies
GOEPEL electronics has added the SFX-5296LX, a next generation mixed signal I/O module to its JTAG/Boundary Scan hardware platform SCANFLEX. It offers a powerful solution to make even non-scannable partitions testable through boundary scan. This, for example, allows testing of assemblies with just one Boundary Scan IC.
Accreditation laboratory installs LTE test solution
A leading accredited laboratory for wireless testing and certification has enhanced the testing capabilities it offers its customers by using the Spirent 8100 LTE solution with support for hVoLTE, Voice over IP (VoIP), Video Telephony, and Carrier Aggregation. SGS will use the test solution to assess the audio, video, signalling, and data throughput performance of mobile devices to ensure they meet the complex carrier requirements of next-generat...
Scanners slash antenna testing times
Designers of antennas and high speed printed circuit boards can cut testing times drastically by using scanners introduced by MDL Technologies. The benchtop scanners from EMSCAN provide real-time images of EMI and antenna emissions, enabling designs to be evaluated in seconds.