Test & Measurement
Vi TECHNOLOGY to show its new 3D AOI System at APEX
Vi TECHNOLOGY will exhibit at the 2016 IPC APEX EXPO and will show its new 3D AOI, coupled with PI series (3D SPI) and SIGMA Link, resulting in a complete 3D inspection solution. K Series3D is the latest evolution of the successful K Series that has been delivering the most accurate component inspection to worldwide leaders in the electronics manufacturing industry for years.
ViTrox to show new products at APEX EXPO
ViTrox Technologies has announced it will exhibit at the 2016 IPC APEX EXPO and that its new products – V310 3D SPI and V-One will be highlights at the event.
Antenna tester accelerates maintenance checks
The Azdec infrared communications system developed by Link Microtek has been enhanced by introducing a compact antenna tester to simplify and speed up the regular checks carried out by maintenance personnel. Typically deployed in naval or commercial maritime applications, the Azdec system provides totally secure, interference-free, short-range communications while allowing operators to roam away from their base positions, unhindered by any traili...
Optical spectrum analyser targets medical devices
The AQ6376 Optical Spectrum Analyser (OSA) from Yokogawa is claimed to set a new ‘world standard’ for grating-based OSA capabilities in measuring signals with a wavelength beyond 3µm, designed to operate in the short-wavelength infrared (SWIR) as well as in the mid-wavelength infrared (MWIR) regions.
Design for Test software debuts at Embedded World
The XJTAG DFT Assistant for Altium Designer will be officially unveiled at Embedded World 2016, Nuremberg (February 23-25). Developed by XJTAG, the free software extension for Altium Designer significantly increases the Design for Test capabilities of the unified schematic capture and PCB design system.
MIRTEC at IPC APEX 2016
MIRTEC is set to show its complete line of 3D AOI and SPI Inspection Systems at the 2016 IPC APEX EXPO. The company will feature a total of seven inspection systems specifically designed to address the full spectrum of inspection requirements associated with the electronics manufacturing industry.
Scienscope’s new X-ray component counter at APEX
Scienscope International will launch its AXI5100c X-ray Component Counter at APEX and showcase some of its flagship AXI products: X-SCOPE 1800, X-SCOPE 6000 and AXI-8000.
Nordson YESTECH to show advanced 3D Technology for AOI at APEX 2016
Nordson YESTECH has announced that it will launch its latest innovation in 3D inspection at the IPC APEX EXPO. The new FX-940 ULTRA 3D AOI incorporates cutting-edge 3D technology for the inspection of solder defects, lead defects/lifted leads, component presence and co-planarity of chips, BGA’s and other height sensitive devices.
X-ray inspection systems at IPC APEX 2016
Nordson DAGE and MatriX Technologies, divisions of Nordson Corporation, will exhibit at the 2016 IPC APEX EXPO. The Nordson DAGE Ruby and Diamond FP MXI (Manual X-ray Inspection) and MatriX Technologies new X3# AXI (Automated X-ray Inspection) systems will be showcased.
CyberOptics to Exhibit at APEX
CyberOptics has announced that it will exhibit at the 2016 IPC APEX EXPO, scheduled to take place March 15-17, 2016 at the Las Vegas Convention Center. The company will showcase CyberOptics’ new SQ3000 3D Automated Optical Inspection (AOI) system.