Test & Measurement
Pre-tested solution analyses sensor data
A collaboration between NI and Hewlett Packard Enterprise (HPE) has produced pre-tested Big Analog Data solutions based on NI DataFinder Server Edition software and HPE Moonshot Systems. Engineers must collect and manage sensor data that is fundamentally different than what traditional big data solutions typically tackle.
PXIe 18-slot chassis offers 24GB/s system bandwidth
A Gen 3 PXIe chassis and set of Gen 3 system components designed for complex, high-performance applications have been introduced by Keysight Technologies. Doubling the system bandwidth, the new products improve data streaming for capture/playback applications, such as 5G and electronic warfare.
Die-level handler tests ICs for high-growth applications
The HA1000 die-level handler is a cost-efficient test solution for determining known good dies (KGD) prior to IC packaging announced by Advantest. Economics is a driving factor in die-level testing. Determining a semiconductor device’s viability prior to packaging or building memory stacks is critical to avoiding rework, achieving high yields and lowering costs.
StudentDAQ version adds 350Ω & 1kΩ quarter-bridge inputs
As part of its continued focus on the classroom, Micro-Measurements, a Vishay Precision Group brand, has introduced a recent version of its popular StudentDAQ pocket-sized, USB-powered data acquisition device for use with resistive strain sensors. Originally available with 120Ω quarter-bridge inputs, the version offers additional 350Ω and 1kΩ quarter-bridge inputs for more precise measurement in a variety of applications.
Mirtec to present at the California Reliability Workshops
MIRTEC has just announced its sponsorship and participation in the Northern and Southern California Reliability Workshops. The Northern CA workshop is scheduled to take place Thursday, June 9th at the Embassy Suites by Hilton Milpitas Silicon Valley. The Southern CA workshop will take place Tuesday, June 7th at the Green Dragon Tavern and Museum in Carlsbad, CA. Brian D’Amico will present “The Electronics Manufacturing Industry R...
PCIe digitiser meets wide range of embedded OEM applications
The 5310A 10-bit PCIe high-speed digitiser running at 10GS/s has been introduced by Keysight Technologies. With its very-high dynamic range and 10-bit resolution across a wide 2.5 GHz bandwidth, the high-speed digitiser allows the capture of fast transients with high fidelity. This unique ADC card is designed for embedded OEM applications, such as medical research, analytical time-of-flight (MS-TOF), environmental monitoring (LiDAR), ultrasonic n...
Low noise accessory enhances electro-acoustic test
The APx1701 Transducer Test Interface has been introduced by Audio Precision. The system integrates instrument-grade amplifiers and microphone power supplies for designers and production test engineers seeking clear insight into the behaviour of their electro-acoustic devices. With a signal-to-noise ratio of 134dB, the APx1701 provides 20dB of fixed-gain amplification from DC to 100kHz
Enhanced protocol simulation added to test tool
An enhanced Protocol Simulation and Conformance Test Tool referred to as Message Automation & Protocol Simulation (MAPS) version 6.4.22 has been announced by GL Communications. GL’s MAPS HD is a high density multi-protocol, multi-technology network appliance that performs signaling and traffic generation for a vast array of communication protocols covering IP and Wireless networks.
System said to revolutionize inspection of probe cards in wafer production
NanoFocus AG has introduced the µsprint hp-opc 3000 which is specially designed to meet the requirements of wafer test locations with a variety of different probe cards as well as large-volume throughputs.
Spectrum analyser boasts enhanced phase noise performance
The new R&S FSVA is a new addition to the Rohde & Schwarz portfolio of midrange signal and spectrum analysers. It offers a 160MHz analysis bandwidth over its entire frequency range, with an ability to do so at frequencies between 26.5GHz and 40GHz. With its enhanced phase noise performance, the instrument offers users very high accuracy in spectral measurements on narrowband modulated signals and in phase noise measurements.