Test and Measurement
Analog Devices Introduces Industry’s First Analog 3-axis, High-g MEMS Accelerometer
Analog Devices, Inc. introduced today the industry's first commercially available analog, 3-axis, high-g MEMS accelerometer. The ADXL377 measures acceleration of high-impact events resulting from shock and vibration, within the full-scale range of ±200 g with no signal saturation.
Anritsu Introduces Tracking Generator with CW Generator for Spectrum MasterT MS2711E, MS2712E and MS2713E Analysers
Anritsu introduces a tracking generator for its Spectrum MasterT MS2711E, MS2712E, and MS2713E models that enhances the overall performance of the handheld analysers, whilst making it easier and faster for field technicians to conduct additional measurements.
LeCroy Announces New SATA Express SSD Decode Support for PCI Express Protocol Analysis
LeCroy Corporation today demonstrated new features added to its PCI Express protocol analyzer line of products that will support testing and debugging of all recently announced PCIe Solid State Drive host interfaces.
LeCroy Announces New 12Gb/s SAS Protocol Analyzer
LeCroy Corporation today announced the addition of the Sierra M124 12Gb/s Serial Attached SCSI Protocol Analyzer platform to its leading Sierra protocol analyzer line of products; supporting protocol testing and debugging of all 12Gb/s SAS and legacy SAS storage interfaces.
Agilent Technologies Introduces Mechanical Qualification System for Dissolution Testing
Agilent Technologies Inc. today introduced the 280-DS Mechanical Qualification System, a new instrument for routine and effortless calibration of a dissolution apparatus. The 280-DS accurately measures, verifies and documents physical parameters established with recently enhanced mechanical qualification standards, eliminating the need for visual interpretation of measurements from manual gauges.
Multitest’s Bowl Feed Option for the MT9928 Is Well Accepted by the Market
Multitest announces a new bowl feed module for the MT9928 xm gravity test handler. This option offers a state-of-the-art solution for temperature test of the smallest devices such as MLF2 and SOT. While Turret is the traditional handling solution, it does not apply when accurate temperature testing is required at hot or cold.
Advantest Introduces T5511 High-Speed Memory Test System Offering Multi-functionality and Industry’s Top Test Speed of 8Gbps
Advantest Corporation announced the availability of its next-generation high-speed DRAM test system, the T5511. The new system, which begins shipping this month, offers the industry's fastest test speed of 8Gbps.
Noise measurements to finished report: The fastest route
Measurement Partner Suite is the free, new post-processing software for Brüel & Kjær's sound level meters and hand-hand analyzers. For the first time, Brüel & Kjær now includes post-processing functionality in the same program that users upload their data to.
With the UDE 3.3, PLS presents the first optimized test and debug solution for the new AURIX 32-bit multi-core MCUs
As a result of the very early and close cooperation with Infineon Technologies and several key customers, PLS now presents the first optimized test and debug solution, the Universal Debug Engine (UDE) 3.3, for the new multi-core architecture of the 32-bit microcontroller family AURIX.
ClareHAL104 and Safety e-Base Pro combine to deliver added test benefits
Production line and type testing across a variety of manufacturing sectors is easier and faster to complete with the ClareHAL104 and Safety e-Base Pro solution from Seaward. The ClareHAL104 and Safety e-Base Pro solution combines advanced PC control software with the latest multi-function safety tester technology to enable end-users in the avionics, appliance, lighting, defence and electronics manufacturing sectors among others to simplify and improve the efficiency of their production line systems.
LEM's new user-programmable HO current transducers
LEM announces the HO series of current transducers, setting a new standard of performance, programmability and ease-of-use for designers of the latest generation of motor drives and inverters. The HO series of open-loop ASIC based current transducers deliver better performance in areas such as thermal drift, response time, power supply and noise driven by technology advances in power electronics applications.
Multitest ecoAmp: New Kelvin Contactor for High-Power Applications
Multitest have announced the debut of its latest Kelvin contactor — a state-of-the-art solution for high-power applications of 500+ Amperes. Current market requirements are driven by energy efficiency, energy harvesting, green energy application, mobility and more. Typically, this application can be found for MOSFET, drivers, IGBT, power modules, and power packages such as TO, SO and DIP.
National Instruments Offers Measurement Microphones Through G.R.A.S. Sound and Vibration
National Instruments today announced that NI Alliance Partner G.R.A.S. Sound & Vibration, a leading producer of acoustic front-end products, now sells microphone kits for use with NI dynamic signal acquisition (DSA) hardware.
Agilent Technologies Introduces Industry's First Integrated Product that Can Characterize All Modern Semiconductor Power Devices
Agilent Technologies Inc. today introduced enhancements to the B1505A Power Device Analyzer/Curve Tracer that significantly increase its voltage and current range to cover all devices in today's fast-growing power-device market.
New Protocols Improve Consistency in Materials Testing for Portable Electronics
W. L. Gore & Associates has developed new testing protocols that improve reliability of acoustic vents used for water and particulate protection in portable electronic devices. These new protocols more effectively match the environmental conditions to which the venting materials are exposed, which results in consistent testing results.
Isabellenhütte achieves record current measurement on shunt basis
Isabellenhütte Heusler GmbH & Co. KG, Hesse, Germany, has made inroads into the high-current range of industrial applications with shunt current measurement. The measurement of currents of up to 30,000 amperes using low-ohmic shunts can truly be seen as unique. Moreover, the company's next target is 100,000 amperes.
MT9928 Gravity Feed Test Handler – Multitest Ships its 1800th Conversion Kit
Multitest announces that it recently shipped the 1,800th conversion kit for its MT9928 xm highly modular gravity feed test handler. This clearly demonstrates the broad coverage of applications required by the market and the excellent acceptance of the MT9928 xm. Handled packages range from SO, TO to QFN and DIL/DIP.
LeCroy Introduces Lowest Cost USB 3.0 Analyser at $2995
LeCroy Corporation today introduced a new USB 3.0 protocol analyser designed to significantly lower the cost of developing and testing new SuperSpeed USB devices. Based on LeCroy's Advisor T3 Standard Edition, the new Basic model at $2995 (US) provides the same lossless data capture with full support for USB 3.0, 2.0 and 1.1 analysis. Now that Intel is shipping USB 3.0 in their 7 Series Chipset, the Advisor T3 Basic is well suited to meet the feature and budget requirements of the cost-conscience mainstream market as companies seek to develop new USB 3.0 products and add USB 3.0 performance to their existing products.
Agilent Technologies Offers Upgrade Packages for Existing NMR Systems
Agilent Technologies Inc. today introduced a suite of electronics and software products designed for use with existing nuclear magnetic resonance spectroscopy systems, extending their value and significantly improving ease of use, performance and reliability. The upgrades are available for magnets manufactured by Oxford Instruments, equipped with VNMRS DD, INOVA, and MERCURY or MERCURYplus consoles. Older consoles with Oxford Instruments magnets are also eligible for console replacement upgrades.
Agilent Technologies Announces FuturePlus Support for DDR4 Measurements
Agilent Technologies Inc. today announced new DDR4 DIMM and SO-DIMM interposer support for the Agilent U4154A, the fastest logic analyzer in the industry. The new interposers from FuturePlus Systems deliver the widest range of DDR4 support, both in product functionality and performance for the Agilent U4154A.
Agilent Technologies Announces Industry's Most Cost-Effective PCI Express 3.0 Flying Lead Probe
Agilent Technologies Inc. today announced a new flying lead solder-down probe for PCI Express 3.0 protocol analysis. The new U4324A probe, for use with Agilent's U4301A protocol analyzer module, is the industry's most cost-effective solder-down probing solution. Agilent's U4301A PCI Express 3.0 protocol analyzer can accept up to four flying lead probes, offering support for up to 16 channels. The module's software enables users to remap any available wire on the probe. It also supports bidirectional capability, upstream or downstream, for every channel.
Agilent Technologies Announces New Express Test Option for Nanomechanical Testing
Agilent Technologies Inc. today announced the immediate availability of Express Test, an ultrafast way to conduct high-precision nanomechanical tests on a broad range of materials. Designed for exclusive use with the popular Agilent Nano Indenter G200, this revolutionary new system option allows 100 indents to be performed at 100 different surface sites in 100 seconds.
Multitest InStrip — Continuously growing installed base: Reliable high parallel handling solution for a broad range of applications
Multitest announces that the InStrip provides a high parallel test handling solution not only for ASICS and sensors in strips, but also for the test of singulated devices. This is accomplished with the InCarrier concept. Based on this broad bandwidth of applications, the number of systems installed in Asia, Europe and the United States is constantly increasing and Multitest is gaining market share.
Don’t get overheated! Optimising temperature measurement applications starts with choosing the right sensors and instrumentation
Temperature measurements are integral to a wide variety of test and measurement applications, which makes it easy to understand why temperature is the most commonly measured parameter. Temperature measurements are part and parcel of: Power supply burn-in; Highly accelerated life testing (HALT); Highly accelerated stress testing (HASS); Device temperature profiling; Environmental stress screening; Plant/environment monitoring and control; Automotive and aerospace control and systems; Consumer product certification/testing laboratories, as well as thousands of other applications
Test contactor system for embedded modules
For testing and programming of embedded modules, Yamaichi presents a test adapter developed in the European Design Centre. The test adapter for embedded modules such as Qseven or MXM particularly stands for: reliable and robust contacting of the module with probe pins which are used for contacting in the semiconductor test, and impedance-controlled design according to customer specifications and/or the Qseven standard.
Agilent Technologies Introduces Fast, Accurate LCR Meter for Testing High-Frequency Passive Components
Agilent Technologies Inc. today introduced the E4982A LCR meter, the newest addition to its LCR family of meters. The Agilent E4982A delivers the best performance for manufacturing passive components such as SMD inductors and EMI filters, where impedance testing at frequencies of 1 MHz to 3 GHz is required. The E4982A's powerful list measurements make it suitable for R&D and quality assurance.
Made-to-measure thermocouples and RTDs
Making it to the range of data acquisition products available from Adept Scientific are Measurement Computing's ready-made thermocouples and RTDs. The ready-made thermocouples are available in 1- and 2m lengths, complete with measuring junction at one end, and are available in J, K, T and E-types.
Now Available: Placing Force Measurement Option on FLX2011
New technologies such as package on package (PoP) component assembly or bare die assembly on COB applications, as well as the optimization of material consumption demands for increased knowledge of the actual placement forces. For this purpose Essemtec has developed a cost-efficient placing force measurement option for the FLX2011 series.
Keithley Expands Measurement Capability of S530 Parametric Test Systems
Keithley Instruments, Inc. continues to enhance the capabilities of its S530 Parametric Test Systems, the semiconductor industry's most cost-effective solution for high speed production parametric test. Supported by the latest version of Keithley Test Environment software (KTE V5.4), the S530 can now be configured for 48-pin full Kelvin switching and with new integrated options for pulse generation, frequency measurements, and low voltage measurements.
Multitest’s Offers Comprehensive Tutorial for Kelvin Contactors
Multitest used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that it now offers a Kelvin Tutorial. A Kelvin contactor is required for economical testing of devices with measurements that are sensitive to contact resistance. A true Kelvin contactor completely eliminates contact-resistance errors from DC parametric tests.
Keithley Introduces High Voltage System SourceMeter Instrument Optimized for High Power Semiconductor Test
Keithley Instruments, Inc. today introduced the Model 2657A High Power System SourceMeter instrument. The Model 2657A adds high voltage to the company's Series 2600A System SourceMeter family of high speed, precision source measurement units.
Geotest Introduces CalEasy Software for PXI Products
Geotest has announced the release of a new software package, CalEasy v1.0 which allows users to verify and recalibrate Geotest PXI instruments. The initial release includes support for Geotest's GX5960 and GX5055 digital instrumentation with subsequent releases incorporating support for all Geotest products. CalEasy offers users the ability to verify and if needed, recalibrate their Geotest instrumentation on-site, eliminating the need to return the instrumentation to Geotest or to use a 3rd party calibration service.
Yokogawa power measurement software provides complete solution for the latest standby power testing standards
A new power measurement software package for the Yokogawa range of precision power analysers provides a complete solution for the testing of standby power in accordance with the latest IEC62301 Ed.2.0 (international) and EN50564:2011 (European) standards.
ADLINK Builds PXI Express Family of Products with Industry-Leading Devices for High-Bandwidth Applications
ADLINK Technology today announced a new family of high-performance PXI and PXI Express (PXIe) products for applications requiring fast data throughput, such as audio and image test. The three new products include: PXES-2590, the industry's first all-hybrid, 9-slot PXIe chassis that provides up to 8 GB/s throughput, PXI-9527, a dynamic signal acquisition (DSA) module that offers 24-bit resolution and IEPE signal conditioning for accurate sound and vibration testing, PXIe-9842, a digitizer with 200 MS/s for dynamic measurements.
Fujitsu Laboratories Develops World's Fastest Simulation Technology Able to Faithfully Reproduce CPU Operations
Fujitsu Laboratories Limited today announced that it has developed the world's fastest simulation technology for systems using the ARM computing core, widely used in mobile phones and other electronic devices. This technology is able to faithfully reproduce hardware operations with cycle-for-cycle real-time accuracy.
Multitest Leverages MT9510x16 for Quad-Site MEMS Applications
Multitest announces that it has expanded its MEMS portfolio to pick-and-place applications with the introduction of its test and calibration cart for the MT9510. Multitest MEMS solutions now are available for strip test and singulated package test–on Multitest InStrip with optional InCarrier,the well-established gravity test handlers MT93xx and MT9928, or the MT9510XP tri-temp pick-and-place handler.
JTAGLive takes Command of MicroCores for PCB Test & Debug
JTAGLive is pleased to announce the introduction of a new series of debug tools for DSP and microprocessor systems utilising a variety of RISC and DSP cores. Using JTAGLive CoreCommander engineers can activate the OCD (On-Chip Debug) modes of a range of popular cores to affect 'kernel-centric' testing.
Multitest Launches Optimal Contactor for High-End Digital Applications
Multitest recently launched the newest member of the Quad Tech contactor family: the Triton contactor for high-end digital applications. The Triton responds to the dedicated needs of these digital applications, which include servers, computers, mobile smartphones, digital TV and graphics.
New 16-channel temperature input module extends electromechanical testing capabilities of Yokogawa DL850 ScopeCorder
A new 16-channel temperature/voltage plug-in input module for the Yokogawa DL850 ScopeCorder has been added to the range of electrical and physical input modules available for this versatile instrument. The new module extends the electromechanical testing capabilities of the DL850 ScopeCorder by allowing it to be used for a wide range of applications where parameters such as voltage and current need to be measured simultaneously with physical parameters such as temperature.
Lite solution for vital signs testing kits from Rigel Medical
The new Rigel Medical Med-eKit Lite is a comprehensive vital signs testing kit in one easy-to-carry and convenient solution. Protected and transported from site-to-site within a new lightweight and water-repellent sling-style carry case, the vital signs kit features the 288 electrical safety analyser and the UNISIM vital sign simulator.
