Test & Measurement
'Practical' DC power supplies meet many applications
The 9130B Series is a new family of programmable triple output DC power supplies from B&K Precision. The new linear triple output power supply line offers three isolated outputs that can be adjusted independently or combined in series or parallel to output higher voltage or current.
Inductive temperature sensing reaches the unreachable
The Technology Partnership (TTP) has developed a non-contact way in which to measure high temperatures for applications ranging from foundries, machining and food processing to use on aircraft engines and braking systems. The patent-pending inductive technique has already been used over temperature ranges of several hundred degrees celsius with a accuracy of 1°C and could replace existing contact methods such as thermocouples and the use of i...
Debug tool integrates with test automation platform
Lauterbach has announced that it has been working with Vector Software to integrate its Trace32 debug tool with Vector Software's VectorCast test automation platform. The integration of these two advanced toolsets will enable development, test and certification teams to set and continuously collect practically unlimited volumes of test data from RAM constrained embedded systems.
Test technology targets IoT devices
JEDOS (JTAG Embedded Diagnostics Operating System) is a new technology for embedded test of complex electronic designs introduced by Goepel Electronics. It has been developed in particular for diagnostic testing of devices for the Internet of Things (IoT). The system architecture offers a complete operating system that uses the natively integrated processor to execute embedded diagnostic functional tests in real time.
Short-pulse terahertz waves technology used for chip circuit analysis
A technology that utilises short-pulse terahertz waves for analysis of electrical circuits has been developed by Advantest. The technology has 2 major applications – analysis of the transmission characteristics (S parameters) of devices using the sub-terahertz band (100GHz~1THz), and characterisation and location of failures in chip circuits (TDT/TDR).
Transport network tester options support RFC6349 spec
Important enhancements have been added to Anritsu’s portable MT1000A Network Master Pro and MT1100A Network Master Flex family of all-in-one transport network testers. The enhancements include the support of CPRI/OBSAI and RFC 6349 TCP throughput testing, Optical Transport Network (OTN) multi stage mapping for OTU3/4, a powerful remote operation tool and support of a Video Inspection Probe.
Decoding option aids design and debug
The RTO-K52 decoding option from Rohde & Schwarz helps developers design, verify and debug modules with 8b/10b encoded buses. At the push of a button, the R&S RTO uses the option's full autoset function to determine the channel, decision level and bit rate settings, allowing developers to quickly start measuring. All of these settings can be readjusted manually.
Transducers isolate nominal measurements
LEM has extended its range of high-accuracy current transducers, announcing the series of IT xx5 transducers for non-intrusive and isolated nominal measurements of DC, AC and pulsed currents from 60 to 600A. The new range includes four models: IT 65-S, IT 205-S, IT 405-S and IT 605-S.
Reduce downtime, equipment failure & energy use
Running manufacturing automation systems at high temperatures will have a major negative impact on the system’s performance and reduce its service life according to Rittal. By not keeping drives at or close to optimum operating temperature, manufacturers risk huge consequential costs when the production line grinds to a halt as a result of system failure.
4CC, 256 QAM added to wireless test set LTE-A capabilities
Keysight Technologies has enhanced the E7515A UXM wireless test set to address leading-edge LTE-A carrier aggregation (CA) test requirements. New capabilities include support for downlink 4CC1, 256 QAM, and LTE-U with up to three unlicensed carriers, as well as FDD-TDD mixed CA and uplink intra- and inter-band CA measurements.