Test & Measurement
eBook throws light on new JTAG standard
A new eBook from ASSET InterTech explains how a relatively new industry standard, IEEE 1687 Internal JTAG (IJTAG), provides critical capabilities not found in older standards, such as the IEEE 1149.1 boundary-scan standard, commonly referred to as JTAG, and the IEEE 1500 embedded core test (ECT) standard.
Data acquisition system scans up to 50,000 samples/sec
A high-speed data acquisition system for dynamic test and measurement applications has been introduced by Micro-Measurements. It features a scanner with 12 RJ-45 strain gauge inputs and four configurable auxiliary slots to accommodate signals from thermocouples, piezoelectric sensors (both charge mode and voltage mode), and high-level voltage sensors.
Industry heavyweights collaborate on TSN testbed
The Industrial Internet Consortium (IIC) and industry leaders including Bosch Rexroth, Cisco, Intel, KUKA, NI, Schneider Electric and TTTech will collaborate to develop the world’s first Time Sensitive Networking (TSN) testbed. These organisations aim to advance the network infrastructure to support the future of the Industrial Internet of Things (IIoT) and Industry 4.0.
EMI test receiver meets commercial & military standards
The R&S ESW EMI test receiver from Rohde & Schwarz is designed for applications in manufacturers’ EMI labs and in test houses. It can carry out certification tests on modules, components and devices as well as on systems and technical facilities in line with all relevant commercial and military standards such as CISPR, FCC and military standards.
Flexible testbed addresses LTE-U and LAA
A system for testing, experimenting on and prototyping new LTE Unlicensed (LTE-U) and/or License Assisted Access (LAA) wireless access technologies has been introduced by NI.. Though 5G has generated significant interest and focus, new technologies such as LTE-U and LAA are needed today to enhance the 4G data experience and help close the gap until 5G arrives.
Digital data acquisition cards acquire at up to 72 MBit/s rates
The M4i.77xx series of Digital Data Acquisition cards from Spectrum are aimed at test engineers who require high-speed digital data logging with multi-channel logic analysis over extended time periods. Based on Spectrum's proven M4i series PCI Express (PCIe) platform the cards are small and compact.
MWC 2016: Test bed takes on challenging WiFi applications
Announced at Mobile World Congress was an agreement for Spirent Communications to deliver a complete Spirent Landslide Wi-Fi and octoScope system supporting real access points and real client devices in the octoBox testbed. The octoBox testbed supports coexistence of multiple wireless technologies such as LTE and 802.11ac Wave-2 including MU-MIMO while providing controllable a real-life RF environment.
MWC 2016: EVS testing targets mobile device R&D
The first test & measurement solution that supports EVS, a full HD voice codec recently developed for Voice over LTE (VoLTE) services by 3GPP was unveiled at Mobile World Congress in Barcelona by Spirent Communications. The EVS codec offers improved audio quality performance at reduced bit rates, with additional features to improve the user experience while reducing costs for wireless service providers.
Web-based dashboard offers software code quality
Vector Software announced VectorCAST/Analytics. VectorCAST/Analytics provides an easy to understand web-based dashboard of software code quality and testing completeness metrics, enabling users to identify trends in a single codebase or compare metrics between multiple codebases. Software projects fall into two categories: maintenance of legacy applications and development of new applications. Each presents a unique challenge. Legacy applica...
Software suite smooths semiconductor modelling path
Integrated Circuits Characterisation and Analysis Program (IC-CAP) 2016, Model Builder Program (MBP) 2016, and Model Quality Assurance (MQA) 2016 have been added to Keysight Technologies’ modelling and characterisation software suite. The software release provides designers characterising and modelling semiconductor devices with further advances in efficiency.