In collaboration with the MIT Industrial Liaison Program (MIT ILP), Schneider Electric and Aster are organising an ‘Innovation Hub’ event focused around one central theme: ‘Digital Energy’. The theme will be addressed through market trend analyses performed by Aster's experts, presentations by Aster portfolio companies, expert speakers from MIT, and a pitching session for young, innovative startups.

ASTER Technologies has developed a major new release of TestWay, the reference in Design for Excellence (DfX), by incorporating an integrated workflow from design through to product delivery. DfX also referred to as DfM (Design for Money) can be used as part of an organization’s Continuous Improvement Programme to decrease product development time, product cost and manufacturing cycle time, while increasing product quality, reliability and ulti...

ASTER, located at booth A1.352 at electronica, develops innovative modules for documentation and engineering: •Documentor is a powerful document management tool that allows quick and easy creation of comprehensive shop floor documentation, as well as the formatting of testability analysis reports. •Engineering Change Order is designed to facilitate post fabrication, PCB modifications.

During Productronica 2011 at the New Munich Trade Fair Centre, ASTER Technologies the leading supplier in Board-Level Testability and Test Coverage analysis tools, will be demonstrating the Design-To-Test features that have been added to the TestWay and TestWay Express, DfT and Test Coverage analysis tools.

During APEX 2011 at the Mandalay Bay Resort & Convention Center in Las Vegas, ASTER Technologies, the leading supplier in Board-Level Testability and Test Coverage analysis products, announces the first tool to provide an integrated workflow for DfT and test coverage analysis from design through to mainstream production.

During Electronica 2010 at the New Munich Trade Fair Centre, ASTER Technologies the leading supplier in Board-Level Testability and Test Coverage analysis tools, announce a new “yield estimation” feature to the TestWay Express test coverage analysis tool.

During APEX 2010 at the New Mandalay Bay Resort & Convention Center in Las Vegas, ASTER Technologies, the leading supplier in Board-Level Testability and Test Coverage analysis tools, will introduce the first Design for Test (DfT) software to combine electrical and mechanical analysis. It has been developed to address a new vision of the DfT market that has to solve the many challenges that developers face today, such as: shrinking release cyc...