Test & Measurement

Open top contactor offers manual and automated IC insertion

18th March 2014
Mick Elliott
0

Yamaichi Electronics presents the new OpenTop Test Contactor in the YED274 series for BGA/CSP, SOP and QFP IC components.  The new OpenTop Test Contactor from Yamaichi Electronics can be used for manual and automated insertion of semiconductor components. A typical application is the programming of memory ICs.

 

The extremely reliable mechanism is notable for a life time of over 500,000 actuations, which have been evaluated successfully in the lab. The outer dimensions have been kept very compact, at 30mm x 50mm.

The socket design was implemented as a modular system. Currently, IC components with dimensions from 4mm x 4mm to 15mm x 15mm can be accommodated. The socket design is expandable for components of up to 20mm x 20mm. For the different IC components outlines, like BGA, QFP and SOP, only minor design modifications are necessary.

Fine-pitch spring contacts are used for contacting. The plunger tip can be varied, with a crown for BGA and a tip for SOP/QFP. IC components with a pitch of 0.35mm and larger can be contacted. The life time of the spring contact is specified with several hundred thousand cycles.

The OpenTop Test Contactor can be equipped with a pushing frame upon request. This simplifies opening the socket for manual actuation.

 

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